From Event: SPIE Optical Engineering + Applications, 2018
Coherent Raman scattering (CRS) is a popular technique for ultrafast spectroscopy and microscopy studies. CRS is based on a third-order nonlinear light-matter interaction, characterized by a nonlinear susceptibility with nonzero elements for bulk samples. It is challenging to perform CRS measurements at interfaces, as bulk contributions can often overwhelm. We have developed a surface-sensitive approach for CRS spectroscopy and microscopy, which enhances the sensitivity to interfacial processes by at least tenfold.
Eric O. Potma and John Kenison, "Coherent Raman scattering at interfaces (Conference Presentation)," Proc. SPIE 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI, 1075305 (Presented at SPIE Optical Engineering + Applications: August 19, 2018; Published: 17 September 2018); https://doi.org/10.1117/12.2322636.5836064704001.
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