From Event: SPIE OPTO, 2019
In this work, we present a family of direct tomography protocols that can characterize various types of high-dimensional photon states. In specific, we show direct tomography approaches that can measure high-dimensional spatial modes, spatial vector modes and partially-coherent modes. In direct tomography methods, the measurement readouts directly correspond to the complex-valued state vector or other quantities that describe the quantum system to be measured, and therefore can significantly reduce the complexity of tomography procedures for high-dimensional states. Moreover, we show that it is possible to design the tomography protocol such that all the information needed to describe the photon states can be acquired in a single experimental setup without any need of scanning. This is particularly interesting for real-time metrology of both quantum and classical photon states. The unique single-shot, direct characterization capability provide powerful real-time metrology tools that can boost fundamental studies and applications of high-dimensional photon states.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhimin Shi, "Direct tomography of high-dimensional photon states (Conference Presentation)," Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342T (Presented at SPIE OPTO: February 07, 2019; Published: 5 March 2019); https://doi.org/10.1117/12.2515661.6010188721001.