A model for standard line-scan imaging spectrometers with circularly symmetric optics is presented. Using reasonable approximations and special cases to maintain clarity, straight-forward analysis demonstrates design options are constrained due to lack of parameters that can readily be engineered. As a result, compromises must be made. This motivates line-scan imaging spectrometers that utilize anamorphic optics. The presented anamorphic design provides an additional degree of engineering freedom and eliminates the need for compromises required in standard systems. Results from a prototype anamorphic line-scan imaging spectrometer are provided, including Signal-to-Noise Ratios and sample imagery.

© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

Rand Swanson, William S. Kirk, Guy C. Dodge, Michael Kehoe, and Casey Smith, "Anamorphic imaging spectrometers," Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 1098005 (Presented at SPIE Defense + Commercial Sensing: April 15, 2019; Published: 13 May 2019); https://doi.org/10.1117/12.2515641.