From Event: SPIE Optical Metrology, 2019
This contribution considers the application of pulsed LED illumination, synchronized with the exposure gap of a CMOS Bayer camera and an oscillating reference mirror, to record two π/2 phase shifted interferograms for quadrature based phase retrieval. Measurements of a superfine roughness standard in lateral motion are presented, demonstrating the capability of the setup to record the surface topography of moving objects. The application of the interferometric measurement data to calibrate a topography measuring wave front sensor, which is employed to support surface unwrapping is also discussed.
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Markus Schake and Peter Lehmann, "Double pulse LED illumination for phase detection in RGB-interferometry," Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110560T (Presented at SPIE Optical Metrology: June 25, 2019; Published: 21 June 2019); https://doi.org/10.1117/12.2525331.