From Event: SPIE Optical Engineering + Applications, 2019
The National Ignition Facility’s (NIF) high-yield DT shots create a harsh radiation environment that can cause electronics to malfunction. This paper documents various design tradeoffs and techniques used for a Microsemi FPGA to reduce the impact of Single Event Upsets (SEUs) that enable a camera to capture images in the NIF target chamber during a high-yield shot.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce Dean, Matthew Dayton, Chris Macaraeg, and Brad Funsten, "Design techniques used to minimize impact of SEU's targeting microsemi FPGA's at the NIF target chamber," Proc. SPIE 11114, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI, 1111418 (Presented at SPIE Optical Engineering + Applications: August 14, 2019; Published: 25 October 2019); https://doi.org/10.1117/12.2529806.
