An innovative highly symmetrical laser scanning microscope using a toroidal reflective scan lens and a highly efficient, low-noise collection system based on a modified Offner configuration. The system was originally developed for applications in two-photon microscopy (TPM). The optics provide for a perfect scanning spot along an arcuate line with no off-axis aberrations. On-axis aberrations are corrected with a free-form compensator placed on the input beam. The perpendicular scanning dimension to the scan line is obtained by linearly translating the whole microscope with respect to the specimen or moving the specimen. The design examples presented are for a 30-mm scan line and an NA of 0.5, and are both refractive and all-reflective, thus with minimum dispersion to prevent pulse broadening.

© (19 November 2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

David Kessler, "Laser scanning microscope with large field and high NA," Proc. SPIE 12078, International Optical Design Conference 2021, 120780A (Presented at International Optical Design Conference - IODC 2021: 19 November 2021; Published: 19 November 2021); https://doi.org/10.1117/12.2603619.