Recently we introduced RESCH microscopy  - a scanning microscope that allows slightly refocusing the sample after the acquisition has been performed, solely by performing appropriate data post-processing. The microscope features a double-helix phase-engineered emission point spread function in combination with camera-based detection. Based on the principle of transverse resolution enhancement in Image Scanning Microscopy [2,3], we demonstrate similar resolution improvement in RESCH. Furthermore, we outline a pathway for how the collected 3D sample information can be used to construct sharper optical sections.
 A. Jesacher, M. Ritsch-Marte and R. Piestun, accepted for Optica.
 C.J.R. Sheppard, “Super-resolution in Confocal imaging,” Optik, 80, 53-54 (1988).
 C.B. Müller and J. Enderlein "Image Scanning Microscopy," Phys. Rev. Lett. 104, 198101 (2010).
Alexander Jesacher, Monika Ritsch-Marte, and Rafael Piestun, "Resolution enhancement in a double-helix phase engineered scanning microscope (RESCH microscope) (Presentation Recording)," Proc. SPIE 9554, Nanoimaging and Nanospectroscopy III, 95540S (Presented at SPIE Nanoscience + Engineering: August 10, 2015; Published: 5 October 2015); https://doi.org/10.1117/12.2190639.4519371112001.
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