In this work, we present an integrated approach of modeling, characterization, and validation to address these problems. A hierarchical modeling framework will allows us to clarify the mechanisms of corrosion, PID, and delamination. We will employ a physics-based compact model of the cell, topology of the electrode interconnection, geometry of the packaging stack, and environmental operating conditions to predict the current, voltage, temperature, and stress distributions in PV modules correlated with the acceleration of specific degradation modes. A self-consistent solution will capture the essential complexity of the technology-specific acceleration of PID and other degradation mechanisms as a function of illumination, ambient temperature, and relative humidity. Initial results from our model include specific lifetime predictions suitable for direct comparison with indoor and outdoor experiments, which are qualitatively validated by prior work. This approach could play a significant role in developing novel accelerated lifetime tests.
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