We demonstrate the ability to map photo-induced gradient forces in materials, using a setup akin to atomic force microscopy. This technique allows for the simultaneous characterization of topographical features and optical near-fields in materials, with a high spatio-temporal resolution. We show that the near-field gradient forces can be translated onto electric fields, enabling the mapping of plasmonic hot-spots in gold nanostructures, and the resolution of sub-10 nm features in photocatalytic materials. We further show that the dispersion-sensitive nature of near-field gradient forces can be used to image and distinguish atomically thin layers of 2-D materials, with high contrast.
Thejaswi U. Tumkur, Chloe Doiron, Xiao Yang, Bo Li, Dayne F. Swearer, Benjamin W. Cerjan, Peter Nordlander, Naomi J. Halas, Pulickel M. Ajayan, Emilie Ringe, and Isabell Thomann, "Mapping near-field environments of plasmonic and 2D materials with photo-induced force imaging
(Conference Presentation)," Proc. SPIE 9918, Metamaterials, Metadevices, and Metasystems 2016, 99180N (Presented at SPIE Nanoscience + Engineering: August 29, 2016; Published: 9 November 2016); https://doi.org/10.1117/12.2239395.5159519574001.
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