From Event: SPIE Optical Engineering + Applications, 2016
Determining the mean square deviation σ of surface roughness and the imaginary part of permittivity n''of a planar gradient optical waveguides n(y)= n3+Δn'(y)+ in''(y) = n'(y)+ in''(y), using the integral waveguide scattering method. For experiment two samples are prepared. The first sample using exchange with silver ions and obtained a parabolic profile, subsequently the method of solid-state diffusion of lead oxide in the glass substrate provides a waveguide with a Gaussian distribution profile permittivity. In both cases, laser radiation is used with a wavelength of 0.6328 microns.
N. Espinosa, A. Osovitsky, J. Vila, L. Cadena, P. Leon, D. Aguilar, C. Vega, and D. Sotomayor, "Determination of mean square deviation of surface roughness in a planar gradient optical waveguide," Proc. SPIE 9948, Novel Optical Systems Design and Optimization XIX, 99480J (Presented at SPIE Optical Engineering + Applications: August 30, 2016; Published: 29 September 2016); https://doi.org/10.1117/12.2237983.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon