From Event: SPIE Optical Engineering + Applications, 2016
The NASA Goddard Space Flight Center (GSFC) and its partners have broad experience in the alignment of flight optical instruments and spacecraft structures. Over decades, GSFC developed alignment capabilities and techniques for a variety of optical and aerospace applications. In this paper, we provide an overview of a subset of the capabilities and techniques used on several recent projects in a “toolbox” format. We discuss a range of applications, from small-scale optical alignment of sensors to mirror and bench examples that make use of various large-volume metrology techniques. We also discuss instruments and analytical tools.
Phillip Coulter, Raymond G. Ohl, Peter N. Blake, Brent J. Bos, Victor J. Chambers, William L. Eichhorn, Jeffrey S. Gum, Theodore J. Hadjimichael, John G. Hagopian, Joseph E. Hayden, Samuel E. Hetherington, David A. Kubalak, Kyle F. Mclean, Joseph C. McMann, Kevin W. Redman, Henry P. Sampler, Greg W. Wenzel, and Jerrod L. Young, "A toolbox of metrology-based techniques for optical system alignment," Proc. SPIE 9951, Optical System Alignment, Tolerancing, and Verification X, 995108 (Presented at SPIE Optical Engineering + Applications: August 28, 2016; Published: 20 October 2016); https://doi.org/10.1117/12.2239070.
Conference Presentations are recordings of oral presentations given at SPIE conferences and published as part of the conference proceedings. They include the speaker's narration along with a video recording of the presentation slides and animations. Many conference presentations also include full-text papers. Search and browse our growing collection of more than 14,000 conference presentations, including many plenary and keynote presentations.
Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon