From Event: SPIE Optical Engineering + Applications, 2016
Optical instruments for space applications with improved performances (smaller pixels and spectral range extension) are becoming more and more sensitive to chemical contamination and particle sedimentation. Outgassing under vacuum conditions causes dramatic flux losses, especially in the UV bandwidth. Furthermore, it is difficult to perform physicochemical analyses of contaminated surfaces on flight models, in a clean room. Conventional analytical techniques such as FTIR (Fourier Transform Infrared interferometer) need the tool to be in contact with the studied area, which is forbidden when working on satellites. In addition, it does not give any information about the distribution of the contaminants in the field of view. The probed area is large, mono-pixel, and the sensitivity of the instrument is too low for hundred nanometer thin film deposits. A first study has shown that we could benefit from using the UV/visible fluorescence spectra to partially identify contaminants and polymer materials. The shape of the fluorescence spectra of adhesives, paints and varnishes have specific signatures that could be recorded into a designated reference database. The location of the presence of these contaminants on such sensitive optics is also relevant. To acquire both these parameters, we designed a specific compact hyperspectral instrument to remotely acquire cube images (500x500 pixels) in a 5 degree field of view, and on a wide range of continuous wavelengths from UV at 320 nm up to the near infrared at 1000 nm. This paper will present the chosen trade-off between different critical optics for a new portable version of this instrument. It is dedicated to space and cultural heritage applications and the first results on an engineering prototype will be shown.
Frédéric Bourcier, Philippe Walter, Silvia Pedetti, Delphine Faye, Piero Spezzigu, Fulvio Infante, Patrice Le Nouy, and Edoardo Zedda, "Hyperspectral instrumentation to image and characterize the fluorescence of materials," Proc. SPIE 9952, Systems Contamination: Prediction, Control, and Performance 2016, 99520J (Presented at SPIE Optical Engineering + Applications: September 01, 2016; Published: 27 September 2016); https://doi.org/10.1117/12.2235592.
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