From Event: SPIE Optical Engineering + Applications, 2016
Recently a real time particle deposition monitoring system is developed. After discussions with optical system engineers a new feature has been added. This enables the real time monitoring of obscuration of exposed optical components by counting the deposited particles and sizing the obscuration area of each particle. This way the Particle Obscuration Rate (POR) can be determined. The POR can be used to determine the risk of product contamination during exposure. The particle size distribution gives information on the type of potential particle sources. The deposition moments will indicate when these sources were present.
Koos Agricola, "Real time obscuration monitoring," Proc. SPIE 9952, Systems Contamination: Prediction, Control, and Performance 2016, 99520L (Presented at SPIE Optical Engineering + Applications: September 01, 2016; Published: 27 September 2016); https://doi.org/10.1117/12.2237260.
Conference Presentations are recordings of oral presentations given at SPIE conferences and published as part of the proceedings. They include the speaker's narration with video of the slides and animations. Most include full-text papers. Interactive, searchable transcripts and closed captioning are now available for 2018 presentations, with transcripts for prior recordings added daily.
Search our growing collection of more than 16,000 conference presentations, including many plenaries and keynotes.