From Event: SPIE Optical Engineering + Applications, 2016
In our previous publications, we had successfully made a deflectometry measurement by using a portable laser projector.
In this research, we propose the beam weighting centroid method rather than previous the phase shifting method for
quantification of the angular direction of the testing beam in the tested optics entrance pupil. By projecting the angular
sequential lines on tested optics entrance pupil, the wavefront aberration is reconstructed from two orthogonal directions
measurements, in a similar way to the line scanning deflectometry. The limited gray scale problem of laser projector during
the phase shifting measurement is therefore eliminated. The reconstructed wavefront is proven to yield a more accurate
result than the phase shifting methods at the cost of more image frames and acquisition time.
Hao-Xun Zhan, Chao-Wen Liang, and Shih-Che Chien, "Angular line scanning deflectometry using a laser pico projector," Proc. SPIE 9960, Interferometry XVIII, 99600O (Presented at SPIE Optical Engineering + Applications: August 31, 2016; Published: 28 August 2016); https://doi.org/10.1117/12.2236289.
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