From Event: SPIE Optical Engineering + Applications, 2016
A concept of an inelastic x-ray scattering (IXS) spectrograph with an imaging analyzer was proposed recently and
discussed in a number of publications (see e.g. Ref.1). The imaging analyzer as proposed combines x-ray lenses with
highly dispersive crystal optics. It allows conversion of the x-ray energy spectrum into a spatial image with very high
energy resolution. However, the presented theoretical analysis of the spectrograph did not take into account details of the
scattered radiation source, i.e. sample, and its impact on the spectrograph performance. Using numerical simulations we
investigated the influence of the finite sample thickness, the scattering angle and the incident energy detuning on the
analyzer image and the ultimate resolution.
Alexey Suvorov and Yong Q. Cai, "Simulation of an IXS imaging analyzer with an extended scattering source," Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 99630A (Presented at SPIE Optical Engineering + Applications: August 31, 2016; Published: 15 September 2016); https://doi.org/10.1117/12.2237868.
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