From Event: SPIE Optical Engineering + Applications, 2016
X-ray imaging of the laser produced plasma plays an important role in plasma diagnostics. Based on the urgent needs of
conducting deeper and finer physical experiments, we developed a high-energy Kirkpatrick Baez microscope working at
17.48keV with a spectral resolution (E/▵E) of ~30. The concave spherical substrates was polished, ultrasonically cleaned
and coated. The substrates have a radius of curvature of 20m with a roughness better than 0.3nm. The grazing incidence
angles are designed at 0.7° and 0.73° for separate reflecting mirrors. The x-ray backlit imaging experiments show its
spatial resolution is ~5.5μm at best focus. The effective field of view is measured to be ~90μm, which is consistent with
the multilayer design. This article provides detailed informations for the optical design, multilayers coating and
characterization of the microscope. The microscope promises to be a high-energy, high-resolution, and energy resolved
X-ray diagnostics instrument for SG series laser facility.
Yaran Li, Baozhong Mu, Qing Xie, Xin Wang, and Zhanshan Wang, "Development of a high-energy Kirkpatrick Baez microscope," Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 99630J (Presented at SPIE Optical Engineering + Applications: September 01, 2016; Published: 15 September 2016); https://doi.org/10.1117/12.2240109.
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