From Event: SPIE Optical Engineering + Applications, 2016
The recent development of a high-brightness MeV-photon source based on inverse-Compton scattering (ICS) has opened
up exciting new possibilities for high-resolution radiography of dense objects. The x-ray beam is extremely bright,
micron-source size, with mrad divergence, and high-spectral density, which makes it ideal for studies where high-resolution
is required. The x-ray source is tunable over a wide range of parameters and we will discuss how the
adjustable source parameters affect both transverse and longitudinal resolution. We then present results on the
radiography of a thick steel object using this ICS source, and demonstrate the capabilities of this source with respect to
operation at high photon energy while providing high spatial resolution.
Daniel Haden, Shouyuan Chen, Baozhen Zhao, Ping Zhang, Grigory Golovin, Wenchao Yan, Colton Fruhling, Sudeep Banerjee, and Donald Umstadter, "High-resolution radiography of thick steel objects using an all-laser-driven MeV-energy x-ray source," Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 99640G (Presented at SPIE Optical Engineering + Applications: August 30, 2016; Published: 16 September 2016); https://doi.org/10.1117/12.2241606.
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