From Event: SPIE Optical Engineering + Applications, 2016
In this article we discuss three different developments in Edge Illumination (EI) X-ray phase contrast imaging
(XPCi), all ultimately aimed at optimising EI computed tomography (CT) for use in different environments, and
for different applications. For the purpose of reducing scan times, two approaches are presented; the reverse
projection" acquisition scheme which allows a continuous rotation of the sample, and the single image" retrieval
algorithm, which requires only one frame for retrieval of the projected phase map. These are expected to lead
to a substantial reduction of EI CT scan times, a prospect which is likely to promote the translation of EI into
several applications, including clinical. The last development presented is the "modified local" phase retrieval.
This retrieval algorithm is specifically designed to accurately retrieve sample properties (absorption, refraction,
scattering) in cases where high-resolution scans are required in non-ideal environments. Experimental results,
using both synchrotron radiation and laboratory sources, are shown for the various approaches.
Anna Zamir, Charlotte K. Hagen, Paul C. Diemoz, Marco Endrizzi, Fabio A. Vittoria, Luca Urbani, Paolo De Coppi, and Alessandro Olivo, "Increased robustness and speed in low-dose phase-contrast tomography with laboratory sources," Proc. SPIE 9967, Developments in X-Ray Tomography X, 996716 (Presented at SPIE Optical Engineering + Applications: August 31, 2016; Published: 4 October 2016); https://doi.org/10.1117/12.2236626.
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