From Event: SPIE Optical Engineering + Applications, 2016
Non-stoichiometry related extended defects in CdTe/CZT, such as tellurium inclusions and precipitates are known to be detrimental bulk defects in detector grade cadmium zinc telluride. In our attempt to minimize the size of tellurium inclusions we have employed accelerated crucible rotation technique in modified vertical Bridgman growth configuration. Acceleration and deceleration rate as high as 900 rpm2 was successfully applied during superheated melt mixing and growth. By comparing growths with and without ACRT under otherwise identical growth conditions, it was observed that the average inclusion size reduced by more than 50 percent due to ACRT. Additionally, we will discuss the effect of forced melt convection on the axial zinc and dopant segregation profile. Electrical characterization, spectrometric performance and purity analysis of the grown crystals will be presented.
Santosh Swain, Jedidiah McCoy, and Kelvin Lynn, "Influence of accelerated crucible rotation on defect distribution and detector characteristics of melt grown CdZnTe
(Conference Presentation)," Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 996806 (Presented at SPIE Optical Engineering + Applications: August 29, 2016; Published: 2 November 2016); https://doi.org/10.1117/12.2238565.5178382277001.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon