From Event: SPIE Optical Engineering + Applications, 2016
Point defects and their concentrations play an important role in limiting the electrical and spectral properties of crystals. It is observed that the crystal-growth process causes the generation of different types of point defects, and these defects create non-uniformities that can be detrimental to device performance. In this research Cd1-xZnxTe1-ySey (CZTS) crystals grown by Bridgman and Travelling heater methods are studied for their point defects. The focus is on the types of defects, their concentrations and the variations with the selected growth method. In addition the effects of growth-related medium and deep energy traps and their corresponding densities are related to the resistivity, life-time of charge carriers and -product for electrons.
Rubi Gul, Aleksey E. Bolotnikov, Giuseppe S. Camarda, Yonggang Cui, Stephen U. Egarievwe, Anwar Hossain, Utpal N. Roy, Ge Yang, and Ralph B. James, "Point defects in Cd1-xZnxTe1-ySey crystals grown by using Bridgman growth and traveling heater method
(Conference Presentation)," Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 996815 (Presented at SPIE Optical Engineering + Applications: August 31, 2016; Published: 2 November 2016); https://doi.org/10.1117/12.2240318.5178382269001.
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