From Event: SPIE Optical Engineering + Applications, 2016
High-quality CdTe semiconductor detectors with both fine position resolution and high energy resolution hold great promise to improve measurement in various hard X-ray and gamma-ray imaging fields. ISAS/JAXA has been developing CdTe imaging detectors to meet scientific demands in latest celestial observation and severe environmental limitation (power consumption, vibration, radiation) in space for over 15 years.
The energy resolution of imaging detectors with a CdTe Schottky diode of In/CdTe/Pt or Al/CdTe/Pt contact is a highlight of our development. We can extremely reduce a leakage current of devises, meaning it allows us to supply higher bias voltage to collect charges. The 3.2cm-wide and 0.75mm-thick CdTe double-sided strip detector with a strip pitch of 250 µm has been successfully established and was mounted in the latest Japanese X-ray satellite. The energy resolution measured in the test on ground was 2.1 keV (FWHM) at 59.5 keV. The detector with much finer resolution of 60 µm is ready, and it was actually used in the FOXSI rocket mission to observe hard X-ray from the sun.
In this talk, we will focus on our research activities to apply space sensor technologies to such various imaging fields as medical imaging. Recent development of CdTe detectors, imaging module with pinhole and coded-mask collimators, and experimental study of response to hard X-rays and gamma-rays are presented. The talk also includes research of the Compton camera which has a configuration of accumulated Si and CdTe imaging detectors.
Shin'ichiro Takeda, Tadashi Orita, Yasuo Arai, Hirotaka Sugawara, Ryota Tomaru, Miho Katsuragawa, Goro Sato, Shin Watanabe, Hirokazu Ikeda, Tadayuki Takahashi, Lars R. Furenlid, and H. Bradford Barber, "High-resolution CdTe detectors with application to various fields
(Conference Presentation)," Proc. SPIE 9969, Radiation Detectors: Systems and Applications XVII, 99690K (Presented at SPIE Optical Engineering + Applications: September 01, 2016; Published: 2 November 2016); https://doi.org/10.1117/12.2242169.5178519673001.
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