From Event: SPIE Optical Engineering + Applications, 2016
Extremely wide-field imaging systems have many advantages regarding large display scenes whether for use in
microscopy, all sky cameras, or in security technologies. The Large viewing angle is paid by the amount of aberrations,
which are included with these imaging systems. Modeling wavefront aberrations using the Zernike polynomials is
known a longer time and is widely used. Our method does not model system aberrations in a way of modeling
wavefront, but directly modeling of aberration Point Spread Function of used imaging system. This is a very complicated
task, and with conventional methods, it was difficult to achieve the desired accuracy. Our optimization techniques of
searching coefficients space-variant Zernike polynomials can be described as a comprehensive model for ultra-wide-field
imaging systems. The advantage of this model is that the model describes the whole space-variant system, unlike the
majority models which are partly invariant systems. The issue that this model is the attempt to equalize the size of the
modeled Point Spread Function, which is comparable to the pixel size. Issues associated with sampling, pixel size, pixel
sensitivity profile must be taken into account in the design. The model was verified in a series of laboratory test patterns,
test images of laboratory light sources and consequently on real images obtained by an extremely wide-field imaging
system WILLIAM. Results of modeling of this system are listed in this article.
Petr Janout, Petr Páta, Petr Skala, Karel Fliegel, Stanislav Vítek, and Jan Bednář, "Application of field dependent polynomial model," Proc. SPIE 9971, Applications of Digital Image Processing XXXIX, 99710F (Presented at SPIE Optical Engineering + Applications: August 29, 2016; Published: 27 September 2016); https://doi.org/10.1117/12.2237310.
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