From Event: SPIE Optical Engineering + Applications, 2016
We describe a new computational approach to image analytics and its application to feature enhancement. The algorithm reveals latent features in the image by a transformation known as the Phase Stretch Transform. This computationally efficient transform emulates the propagation of light through a physical medium followed by detection of light’s complex amplitude. We show that the phase of the transform reveals transitions in image intensity and can be used for edge detection with excellent low light level sensitivity. When the diffractive medium has a warped frequency response, the transform engineers the space-bandwidth product of the image with potential application in data compression. Image processing inspired by optical physics has emerged from the research on Photonic Time Stretch, a time-domain signal processing technique that employs temporal dispersion to slow down, capture, and digitally process fast waveforms in real time. This talk will focus on the Phase Stretch Transform (PST), its extension to machine learning and applications in radiology, astronomy and security image analytics.
Bahram Jalali and Mohamad Asghari, "Physics-inspired image analytics
(Conference Presentation)," Proc. SPIE 9971, Applications of Digital Image Processing XXXIX, 99710Y (Presented at SPIE Optical Engineering + Applications: August 30, 2016; Published: 2 November 2016); https://doi.org/10.1117/12.2240295.5178519710001.
Conference Presentations are recordings of oral presentations given at SPIE conferences and published as part of the conference proceedings. They include the speaker's narration along with a video recording of the presentation slides and animations. Many conference presentations also include full-text papers. Search and browse our growing collection of more than 14,000 conference presentations, including many plenary and keynote presentations.
Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon