From Event: SPIE Optical Engineering + Applications, 2016
The low-frequency noise is a ubiquitous phenomenon and the spectral power density of this fluctuation process is inversely proportional to the frequency of the signal. We have measured the 1/f noise of a 640x512 pixel quantum well infrared photodetector (QWIP) focal plane array (FPA) with 6.2 μm peak wavelength. Our experimental observations show that this QWIP FPA’s 1/f noise corner frequency is about 0.1 mHz. With this kind of low frequency stability, QWIPs could unveil a new class of infrared applications that have never been imagined before. Furthermore, we present the results from a similar 1/f noise measurement of bulk InAsSb absorber (lattice matched to GaSb substrate) nBn detector array with 4.0 μm cutoff wavelength.
S. D. Gunapala, S. B. Rafol, D. Z. Ting, A. Soibel, C. J. Hill, A. Khoshakhlagh, J. Nguyen, L. Baker, A. Fisher, J. K. Liu, J. M. Mumolo, S. A. Keo, and B. Pepper, "1/f noise QWIPs, superlattice, and nBn detectors," Proc. SPIE 9973, Infrared Remote Sensing and Instrumentation XXIV, 997302 (Presented at SPIE Optical Engineering + Applications: August 29, 2016; Published: 14 September 2016); https://doi.org/10.1117/12.2236556.
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Study of self-shadowing effect as a simple means to realize nanostructured thin films and layers with special attentions to birefringent obliquely deposited thin films and photo-luminescent porous silicon