From Event: SPIE Optical Engineering + Applications, 2016
Preliminary testing of a three-slit prism-based spectrometer is presented to test means of exploiting data from a multi-slit spectrometer as well as some potential ways of dealing with complications that arise when using multiple slits. When using a multiple slit spectrometer to boost SNR there are two primary concerns: first, the spectral axis of each slit must be nearly identical to effective average and second, the image from each slit must be well-registered. Based on some of these complications it seems, given the current technology, the best operational mode is to use the sensor to increase area coverage.
Jacob A. Martin and Joseph Meola, "Data processing for a multi-slit LWIR HSI spectrometer," Proc. SPIE 9976, Imaging Spectrometry XXI, 997607 (Presented at SPIE Optical Engineering + Applications: August 29, 2016; Published: 19 September 2016); https://doi.org/10.1117/12.2239123.
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