The accurate knowledge of IR detectors specifications becomes of higher importance whatever the application. Among these specifications is the relative spectral response. The usual method of relative spectral response measurement uses a source spectrally defined by the wavelength selection through a grating-based monochromator. This simple and proven method has a limited spectral resolution since the signal received by the tested detector is proportional to the width of the wavelength selection slit i.e. the spectral resolution. Another method consists in using a Fourier Transform IR Spectrometer (FTIR) easily allowing a 1 cm-1 spectral resolution even in the Long Wave IR range. However, the implementation of this method requires a meticulous analysis of all the elements of the bench and all the parameters to avoid any misinterpretation of the results. Among the potential traps are the frequency dependence of the signals and the parasitic fringes effect on the curves. Practical methods to correct the frequency dependence of the reference detector and to remove parasitic interference fringes are presented in this paper.
Catherine Barrat, Thierry Lepot, Michael Ramamonjisoa, and Sébastien Fradcourt, "A practical implementation of high resolution relative spectral response measurement of CMOS IRFPAs using Fourier Transform Infrared Spectrometer (FTIR)," Proc. SPIE 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII, 99870V (Presented at SPIE Security + Defence: September 29, 2016; Published: 21 October 2016); https://doi.org/10.1117/12.2242014.
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