From Event: SPIE Quantum West, 2023
The presentation will cover our efforts towards the metrology of quantum networks and review the metrology tools developed in our labs at NIST for quantum component and quantum network characterization, including the characterization of single-photon sources and detectors, quantum network node synchronization and entanglement distribution augmented by quantum network management and control.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas Gerrits, "Optical quantum network metrology: from component testing to quantum network metrology," Proc. SPIE PC12447, Quantum Sensing, Imaging, and Precision Metrology, PC124471F (Presented at SPIE Quantum West: January 30, 2023; Published: 9 March 2023); https://doi.org/10.1117/12.2657189.6321511929112.