
refine by

SEARCH WITHIN
PRESENTATIONS
YEAR -
Range
Single Year
CONFERENCE NAME -
TECHNOLOGY -
KEYWORDS -
ACCESS -
CONTENT TYPE -

View Details
Just Watched
22:15
22 June 2022
Ultra-broadband omnidirectional-distributed Bragg-reflectors for near-IR to longwave-IR thermophotovoltaic devices
Zunaid Omair, et al.

View Details
Just Watched
35:07
22 June 2022
High dielectric permittivity elastomers: synthesis, processability, and device manufacturing
Yauhen Sheima, et al.

View Details
Just Watched
12:49
13 June 2022
High performance portable pulse eddy current thermography tester
Meir Gershenson, et al.

View Details
Just Watched
24:01
13 June 2022
Engineered optics: high-volume manufacturing of metasurface optical devices
Rutger M. Thijssen, et al.

View Details
Just Watched
19:23
13 June 2022
Improving wet etch resistance of organic underlayers
Anton Chavez, et al.

View Details
Just Watched
13:07
13 June 2022
Patterning options for post-copper metallization on EUV self-aligned double patterning method
Eric Liu, et al.

View Details
Just Watched
18:25
13 June 2022
Feasibility study of machine learning modeling for full chip optical proximity correction
Yuping Cui, et al.

View Details
Just Watched
17:44
13 June 2022
EUV phase scatterometry with linearized rigorous scattering
Stuart Sherwin, et al.

View Details
Just Watched
39:56
13 June 2022
Photomasks unmasked: confessions of a recovering lithographer
Christopher Progler, et al.

View Details
Just Watched
34:00
13 June 2022
SEM inspection for logic yield development and control
Timothy Crimmins, et al.

View Details
Just Watched
33:33
13 June 2022
Patterning liquids: liquid metals for soft and additive electronics
Michael Dickey, et al.

View Details
Just Watched
42:07
13 June 2022
Why is Google investing in fully open source PDKs?
Tim Ansell, et al.

View Details
Just Watched
34:54
13 June 2022
In-situ thermal imaging in advanced manufacturing
Vincent Paquit, et al.

View Details
Just Watched
30:44
13 June 2022
Automatic target recognition: past, present, future
Edmund Zelnio, et al.

View Details
Just Watched
41:42
13 June 2022
New era of logic technology evolution: Z-dimensional scaling
Dechao Guo, et al.

View Details
Just Watched
79:54
13 June 2022
0.55NA EUV progress towards production in 2025
Mark Phillips, et al.
Sort By
Display

Loading...
Please refine your search query.