PROCEEDINGS VOLUME 0182
TECHNICAL SYMPOSIUM EAST | 17-20 APRIL 1979
Imaging Applications for Automated Industrial Inspection and Assembly
IN THIS VOLUME

0 Sessions, 24 Papers, 0 Presentations
All Papers  (24)
TECHNICAL SYMPOSIUM EAST
17-20 April 1979
Washington, D.C., United States
All Papers
Proc. SPIE 0182, Survey On Vision Systems For Advanced Automation In Japan, 0000 (10 October 1979); doi: 10.1117/12.957365
Proc. SPIE 0182, Measuring Method Of Quality Of Luster: Measurement And Analysis Of Microstructural Reflection Characteristics, 0000 (10 October 1979); doi: 10.1117/12.957366
Proc. SPIE 0182, New Image Processing Hardwares And Their Applications To Industrial Automation, 0000 (10 October 1979); doi: 10.1117/12.957367
Proc. SPIE 0182, Industrial Visual System By A Symmetry Operator, 0000 (10 October 1979); doi: 10.1117/12.957368
Proc. SPIE 0182, Fundamental Study On Automatic Fabric Inspection By Computer Image Processing, 0000 (10 October 1979); doi: 10.1117/12.957369
Proc. SPIE 0182, Automatic Mask Pattern Inspection For Printed Circuits Based On Pattern Width Measurement, 0000 (10 October 1979); doi: 10.1117/12.957370
Proc. SPIE 0182, Automatic Fingerprint Identification, 0000 (10 October 1979); doi: 10.1117/12.957371
Proc. SPIE 0182, The Leuven Automatic Visual Inspection Machine (LAVIM), 0000 (10 October 1979); doi: 10.1117/12.957372
Proc. SPIE 0182, Defect Detection On The Internal Surfaces Of Hydraulics Cylinders For Motor Vehicles, 0000 (10 October 1979); doi: 10.1117/12.957373
Proc. SPIE 0182, Development of techniques for automated industrial inspection in the United Kingdom in the age of microprocessors, 0000 (10 October 1979); doi: 10.1117/12.957374
Proc. SPIE 0182, Precision Image Isocon TV Camera, 0000 (10 October 1979); doi: 10.1117/12.957375
Proc. SPIE 0182, Applications Of A Flexible Pattern Recognition System In Industrial Inspection, 0000 (10 October 1979); doi: 10.1117/12.957376
Proc. SPIE 0182, Recent Applications Of Electronic Vision To Noncontact Automatic Inspection, 0000 (10 October 1979); doi: 10.1117/12.957377
Proc. SPIE 0182, Solid-State Monolithic Photodiode Array-A System Component, 0000 (10 October 1979); doi: 10.1117/12.957378
Proc. SPIE 0182, Missing-Hole Detection System Using Solid-State Video Cameras, 0000 (10 October 1979); doi: 10.1117/12.957379
Proc. SPIE 0182, High-Resolution Computer-Controlled Television System For Hybrid Circuit Inspection, 0000 (10 October 1979); doi: 10.1117/12.957380
Proc. SPIE 0182, Robust Feature Matching Through Maximal Cliques, 0000 (10 October 1979); doi: 10.1117/12.957381
Proc. SPIE 0182, Panel Discussion On Industrial Visual Automation, 0000 (10 October 1979); doi: 10.1117/12.957382
Proc. SPIE 0182, Simulated Neutron Tomography For Nondestructive Assays, 0000 (10 October 1979); doi: 10.1117/12.957383
Proc. SPIE 0182, Nonintrusive Transaxial Tomography Technique For Velocity Profile Measurement, 0000 (10 October 1979); doi: 10.1117/12.957384
Proc. SPIE 0182, Explosives Detection By Dual-Energy Computed Tomography (CT), 0000 (10 October 1979); doi: 10.1117/12.957385
Proc. SPIE 0182, Tomographic Analysis Of Structural Materials, 0000 (10 October 1979); doi: 10.1117/12.957386
Proc. SPIE 0182, Measuring Surfaces Space-Coded By A Laser-Projected Dot Matrix, 0000 (10 October 1979); doi: 10.1117/12.957387
Proc. SPIE 0182, Laser Electro-Optic System For Three-Dimensional (3D) Topographic Mensuration, 0000 (10 October 1979); doi: 10.1117/12.957388
Back to Top