PROCEEDINGS VOLUME 0210
OPTICS, PHOTONICS, AND ICONICS ENGINEERING MEETING | 26-30 NOVEMBER 1979
2nd European Congress on Optics Applied to Metrology
IN THIS VOLUME

0 Sessions, 32 Papers, 0 Presentations
All Papers  (32)
OPTICS, PHOTONICS, AND ICONICS ENGINEERING MEETING
26-30 November 1979
Strasbourg, France
All Papers
Proc. SPIE 0210, Holographic Measurement Of Two-Dimensional Optical Transfer Functions Of Lenses, 0000 (20 May 1980); doi: 10.1117/12.958307
Proc. SPIE 0210, Hybrid Holographic Computer-Made Image Processing, 0000 (20 May 1980); doi: 10.1117/12.958308
Proc. SPIE 0210, Automatic Evaluation Of Young's Fringes Related To The Study Of In-Plane-Deformations By Speckle Techniques, 0000 (20 May 1980); doi: 10.1117/12.958309
Proc. SPIE 0210, Flow Velocity Measurement By A Speckle Method, 0000 (20 May 1980); doi: 10.1117/12.958310
Proc. SPIE 0210, Measurement Of Vibratory Strains On A Turbine Blade By Tandem Speckle Photography, 0000 (20 May 1980); doi: 10.1117/12.958312
Proc. SPIE 0210, Optical Heterodyning And Doppler Effect Applied To Laser Vibrometers And Anemometers, 0000 (20 May 1980); doi: 10.1117/12.958313
Proc. SPIE 0210, Interferential Wavelengths Comparison With Real-Time Signal Processing, 0000 (20 May 1980); doi: 10.1117/12.958314
Proc. SPIE 0210, Vander Lugt Filter Optimization For The Metrology In Industrial And Scientific Research, 0000 (20 May 1980); doi: 10.1117/12.958315
Proc. SPIE 0210, Multichannel Laser System For Multiple Wavelength Cinematographic And Interferometric Diagnostic, 0000 (20 May 1980); doi: 10.1117/12.958316
Proc. SPIE 0210, Subpicosecond Dye Laser Pulses: A New Tool For Optical Metrology, 0000 (20 May 1980); doi: 10.1117/12.958317
Proc. SPIE 0210, Optical Metrologic Evaluation Of Cotton Fabrics, 0000 (20 May 1980); doi: 10.1117/12.958318
Proc. SPIE 0210, Determination Of Size Distributions Of Small Objects By Optical Fourier Transformation, 0000 (20 May 1980); doi: 10.1117/12.958319
Proc. SPIE 0210, Analysis Method Of The Spatio-Temporal Structure Of An Acoustic Field In The Air With The Aid Of Its Optical Fourier Transform, 0000 (20 May 1980); doi: 10.1117/12.958320
Proc. SPIE 0210, Precise Measurements Of Light And Color, 0000 (20 May 1980); doi: 10.1117/12.958321
Proc. SPIE 0210, The Dalembertometer, 0000 (20 May 1980); doi: 10.1117/12.958322
Proc. SPIE 0210, Laser Beam Scanning For Remote Control, 0000 (20 May 1980); doi: 10.1117/12.958323
Proc. SPIE 0210, Particle Analysis By Digital Processing Of Three-Dimensional Hologram Reconstructions, 0000 (20 May 1980); doi: 10.1117/12.958324
Proc. SPIE 0210, Sandwich Holography For Compensation Of Rigid Body Motion And Reposition Of Large Objects, 0000 (20 May 1980); doi: 10.1117/12.958325
Proc. SPIE 0210, Holographic Vibration Analysis Of Rotating Objects Using Different Types Of Interferometers, 0000 (20 May 1980); doi: 10.1117/12.958326
Proc. SPIE 0210, Holographic Interferometry For Brittle Materials, 0000 (20 May 1980); doi: 10.1117/12.958327
Proc. SPIE 0210, Holographic Study Of The Dispersoids In Technical Chemistry, 0000 (20 May 1980); doi: 10.1117/12.958328
Proc. SPIE 0210, System For The Automatic Analysis Of Interferograms Obtained By Holographic Interferometry, 0000 (20 May 1980); doi: 10.1117/12.958329
Proc. SPIE 0210, Controls Of Aeronautical Structures Under Fatigue Testing By Holographic Pulsed Lasers Interferometry, 0000 (20 May 1980); doi: 10.1117/12.958330
Proc. SPIE 0210, Measurement Of Surface Tension By Holographic Interferometry, 0000 (20 May 1980); doi: 10.1117/12.958331
Proc. SPIE 0210, Non-Destructive Testing By Means Of Holographic Interferometry Of Wound Pressure Vessels, 0000 (20 May 1980); doi: 10.1117/12.958332
Proc. SPIE 0210, Measurement Of Three-Dimensional Displacement By Four Small Holograms, 0000 (20 May 1980); doi: 10.1117/12.958333
Proc. SPIE 0210, Analysis By Real-Time Holographic Interferometry Of Heat Transfer At The Surface Of Cold Solar Collectors, 0000 (20 May 1980); doi: 10.1117/12.958334
Proc. SPIE 0210, Compact Device For Interferometric Holography, 0000 (20 May 1980); doi: 10.1117/12.958335
Proc. SPIE 0210, Quantitative Evaluation Of Holographic Interference Patterns Under Image Processing Aspects, 0000 (20 May 1980); doi: 10.1117/12.958336
Proc. SPIE 0210, Comparison Of Holographic Measurements And Theoretical Calculations For Vibration Studies, 0000 (20 May 1980); doi: 10.1117/12.958337
Proc. SPIE 0210, Vibration Analysis By Stroboscopic, Two-Reference-Beam Heterodyne Holographic Interferometry, 0000 (20 May 1980); doi: 10.1117/12.958338
Proc. SPIE 0210, Effective Practical Use Of Holography And Related Technologies In Industry, 0000 (20 May 1980); doi: 10.1117/12.958339
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