PROCEEDINGS VOLUME 0220
1980 LOS ANGELES TECHNICAL SYMPOSIUM | 4-7 FEBRUARY 1980
Optics in Metrology and Quality Assurance
IN THIS VOLUME

0 Sessions, 24 Papers, 0 Presentations
All Papers  (24)
1980 LOS ANGELES TECHNICAL SYMPOSIUM
4-7 February 1980
Los Angeles, United States
All Papers
Proc. SPIE 0220, Computer Image Processing And Recognition, 0000 (28 May 1980); doi: 10.1117/12.958573
Proc. SPIE 0220, New Digital Interferometric Output Analyzer And Display System, 0000 (28 May 1980); doi: 10.1117/12.958574
Proc. SPIE 0220, How To Control Color Appearance With Instrumentation, 0000 (28 May 1980); doi: 10.1117/12.958575
Proc. SPIE 0220, High-Speed Single Particle Sizing By Light Scattering In A Flow System, 0000 (28 May 1980); doi: 10.1117/12.958576
Proc. SPIE 0220, Measurements Of Small Dimensions Of Products And By-Products, 0000 (28 May 1980); doi: 10.1117/12.958577
Proc. SPIE 0220, Inferential Physical Measurements Using Detectors And Detector Arrays, 0000 (28 May 1980); doi: 10.1117/12.958578
Proc. SPIE 0220, Applications Of Visual Task Automation In Aerospace Manufacturing, 0000 (28 May 1980); doi: 10.1117/12.958579
Proc. SPIE 0220, Techniques For Evaluation Of Aircraft Windscreen Optical Distortion, 0000 (28 May 1980); doi: 10.1117/12.958580
Proc. SPIE 0220, Aspheric Testing By Conventional Interferometry, 0000 (28 May 1980); doi: 10.1117/12.958581
Proc. SPIE 0220, Direct Phase Measurement In Spherical Wave Fizeau Interferometers, 0000 (28 May 1980); doi: 10.1117/12.958582
Proc. SPIE 0220, Optical Open-Area Ratiometer, 0000 (28 May 1980); doi: 10.1117/12.958583
Proc. SPIE 0220, Aircraft Quality Assurance Using Close-Range Photogrammetry, 0000 (28 May 1980); doi: 10.1117/12.958584
Proc. SPIE 0220, Automatic Workpiece Surface Tracker For Laser Cutter, 0000 (28 May 1980); doi: 10.1117/12.958585
Proc. SPIE 0220, Automated Optical Inspection Of Multilayer Printed Circuit Boards, 0000 (28 May 1980); doi: 10.1117/12.958586
Proc. SPIE 0220, Microdensitometer Measurements Of Photomask Quality, 0000 (28 May 1980); doi: 10.1117/12.958587
Proc. SPIE 0220, Photomask Mensuration With The Linear Microdensitometer, 0000 (28 May 1980); doi: 10.1117/12.958588
Proc. SPIE 0220, Infrared Testing Of Printed Circuit Boards And Hybrids, 0000 (28 May 1980); doi: 10.1117/12.958589
Proc. SPIE 0220, Thick-Film Hybrid Inspection With A Computer-Controlled High Resolution Imaging And Storage System, 0000 (28 May 1980); doi: 10.1117/12.958590
Proc. SPIE 0220, Computerized Measuring Microscope, 0000 (28 May 1980); doi: 10.1117/12.958591
Proc. SPIE 0220, Considerations In The Design And Specifications Of An Automatic Inspection System, 0000 (28 May 1980); doi: 10.1117/12.958592
Proc. SPIE 0220, Industrial Robots: Today And Tomorrow, 0000 (28 May 1980); doi: 10.1117/12.958594
Proc. SPIE 0220, Image Processing Applications In Nondestructive Examination (N De), 0000 (28 May 1980); doi: 10.1117/12.958595
Proc. SPIE 0220, On-line Inspection For Nonwoven Fabrics, 0000 (28 May 1980); doi: 10.1117/12.958596
Proc. SPIE 0220, On-line Optical Gaging, 0000 (28 May 1980); doi: 10.1117/12.958597
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