PROCEEDINGS VOLUME 0225
1980 TECHNICAL SYMPOSIUM EAST | 8-11 APRIL 1980
Infrared Image Sensor Technology
IN THIS VOLUME

0 Sessions, 21 Papers, 0 Presentations
All Papers  (21)
1980 TECHNICAL SYMPOSIUM EAST
8-11 April 1980
Washington, D.C., United States
All Papers
Proc. SPIE 0225, Hybrid Focal-Plane Array Development, 0000 (6 August 1980); doi: 10.1117/12.958696
Proc. SPIE 0225, Mosaic Focal Plane Evaluation Technique, 0000 (6 August 1980); doi: 10.1117/12.958697
Proc. SPIE 0225, N-Channel Metal Oxide Semiconductor (NMOS) Silicon Signal Processors For On-Focal-Plane Applications, 0000 (6 August 1980); doi: 10.1117/12.958698
Proc. SPIE 0225, Multiplexed Intrinsic Detector Arrays With Signal Processing (MIDASP) Program Development Of Hybrid Technology For Advanced Scanning Systems, 0000 (6 August 1980); doi: 10.1117/12.958699
Proc. SPIE 0225, Unconventional Focal-Plane Architecture (FPA), 0000 (6 August 1980); doi: 10.1117/12.958700
Proc. SPIE 0225, Pulse-bias Mosaic Test Data And Subassembly Configuratior, 0000 (6 August 1980); doi: 10.1117/12.958701
Proc. SPIE 0225, Advances In (Hg,Cd)Te Materials Technology, 0000 (6 August 1980); doi: 10.1117/12.958702
Proc. SPIE 0225, Advances in InSb Charge Injection Device (CID) Focal Planes, 0000 (6 August 1980); doi: 10.1117/12.958703
Proc. SPIE 0225, Extrinsic Silicon Focal-Plane Technology, 0000 (6 August 1980); doi: 10.1117/12.958704
Proc. SPIE 0225, Advances In Platinum Silicide Schottky-Barrier IR-CCD Image Sensors, 0000 (6 August 1980); doi: 10.1117/12.958705
Proc. SPIE 0225, Coded-Bias Mosaics, 0000 (6 August 1980); doi: 10.1117/12.958706
Proc. SPIE 0225, Issues In Advanced Focal Plane Manufacturing And Evaluation, 0000 (6 August 1980); doi: 10.1117/12.958707
Proc. SPIE 0225, Focal-Plane Evaluation, 0000 (6 August 1980); doi: 10.1117/12.958708
Proc. SPIE 0225, Focal Plane Testing From A Production Point Of View: A Tutorial, 0000 (6 August 1980); doi: 10.1117/12.958709
Proc. SPIE 0225, Nomenclature For Focal Surface Radiometry, 0000 (6 August 1980); doi: 10.1117/12.958710
Proc. SPIE 0225, Computer-Aided Facility For The Rapid Evaluation And Optimization Of IR Image Sensors, 0000 (6 August 1980); doi: 10.1117/12.958711
Proc. SPIE 0225, Implementation Of Image Preprocessing Functions Using CCD LSI Circuits, 0000 (6 August 1980); doi: 10.1117/12.958712
Proc. SPIE 0225, IR Signal Processing Under Zodiacal Light Background, 0000 (6 August 1980); doi: 10.1117/12.958713
Proc. SPIE 0225, Measurement Of Noise Sources In P-Surface Channel Charge Coupled Device (CCD) Multiplexers For Infrared Focal Plane Arrays, 0000 (6 August 1980); doi: 10.1117/12.958714
Proc. SPIE 0225, Evaluation Of Flight Data From A Mosaic Sensor, 0000 (6 August 1980); doi: 10.1117/12.958715
Proc. SPIE 0225, Spatial And Temporal Tests Of IR Detectors With Tunable Diode Lasers, 0000 (6 August 1980); doi: 10.1117/12.958716
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