PROCEEDINGS VOLUME 0316
1981 BROOKHAVEN CONFERENCES | 16-20 NOVEMBER 1981
High Resolution Soft X-Ray Optics
IN THIS VOLUME

0 Sessions, 28 Papers, 0 Presentations
All Papers  (28)
1981 BROOKHAVEN CONFERENCES
16-20 November 1981
Upton, United States
All Papers
Proc. SPIE 0316, Metrological Evaluation Of Grazing Incidence Mirrors, 0000 (24 March 1982); doi: 10.1117/12.933117
Proc. SPIE 0316, Use Of Phase Measuring Interferometry For Surface Characterization, 0000 (24 March 1982); doi: 10.1117/12.933118
Proc. SPIE 0316, Short Wavelength Interferometric Testing Of X-Ray Optics, 0000 (24 March 1982); doi: 10.1117/12.933120
Proc. SPIE 0316, Automated Cylindrical Polishing Of Grazing Incidence X-Ray Mirrors, 0000 (24 March 1982); doi: 10.1117/12.933121
Proc. SPIE 0316, Diamond Machining And Mechanical Inspection Of Optical Components, 0000 (24 March 1982); doi: 10.1117/12.933123
Proc. SPIE 0316, Surface Profiling By Electro-Optical Phase Measurements, 0000 (24 March 1982); doi: 10.1117/12.933126
Proc. SPIE 0316, Status Report On Contact X-Ray Microscopy, 0000 (24 March 1982); doi: 10.1117/12.933127
Proc. SPIE 0316, Low Angle X-Ray Scattering Of Chloroplast With CK a-Radiation, 0000 (24 March 1982); doi: 10.1117/12.933130
Proc. SPIE 0316, Grazing Incidence Relay Optics, 0000 (24 March 1982); doi: 10.1117/12.933132
Proc. SPIE 0316, X-Ray And Extreme Ultraviolet Imaging Using Layered Synthetic Microstructures, 0000 (24 March 1982); doi: 10.1117/12.933135
Proc. SPIE 0316, Design And Assembly Of A High Resolution Schwarzschild Microscope For Soft X Rays, 0000 (24 March 1982); doi: 10.1117/12.933138
Proc. SPIE 0316, Status Of The Zone Plate Microscope, 0000 (24 March 1982); doi: 10.1117/12.933140
Proc. SPIE 0316, Status Of The Sputtered Sliced Zone Plates For X-Ray Microscopy, 0000 (24 March 1982); doi: 10.1117/12.933141
Proc. SPIE 0316, Status Of The Scanning X-Ray Microscope, 0000 (24 March 1982); doi: 10.1117/12.933142
Proc. SPIE 0316, Status Of Microstructure Fabrication, 0000 (24 March 1982); doi: 10.1117/12.933143
Proc. SPIE 0316, Optical Performance Of Apodized Zone Plates, 0000 (24 March 1982); doi: 10.1117/12.933144
Proc. SPIE 0316, Fabrication Of Transmission Gratings For Use In X-Ray Astronomy, 0000 (24 March 1982); doi: 10.1117/12.933145
Proc. SPIE 0316, Space And Time Resolved Soft X-Ray Spectra Using X-Ray Transmission Gratings, 0000 (24 March 1982); doi: 10.1117/12.933146
Proc. SPIE 0316, Extra-Solar Astronomy With A 2.4 M Normal Incidence X-Ray Telescope At 0.1 Arcsec Resolution, 0000 (24 March 1982); doi: 10.1117/12.933147
Proc. SPIE 0316, Solar Corona At High Resolution, 0000 (24 March 1982); doi: 10.1117/12.933148
Proc. SPIE 0316, Calculated Performance Of A Wolter Type I X-Ray Telescope Coated By Multilayers, 0000 (24 March 1982); doi: 10.1117/12.933149
Proc. SPIE 0316, Imaging Performance Of A Normal Incidence X-Ray Telescope Measured At 0.18 keV, 0000 (24 March 1982); doi: 10.1117/12.933150
Proc. SPIE 0316, Reflectivity And Resolution Measurements Of Metallic Multilayers, Beryl, And Potassium Acid Phthalate (KAP) With Synchrotron Radiation In The 1 keV Region, 0000 (24 March 1982); doi: 10.1117/12.933151
Proc. SPIE 0316, High Resolution X-Ray Scattering Measurements, 0000 (24 March 1982); doi: 10.1117/12.933152
Proc. SPIE 0316, X-Ray Scattering Of Superpolished Flat Mirror Samples, 0000 (24 March 1982); doi: 10.1117/12.933153
Proc. SPIE 0316, Intense Plasma Source For X-Ray Microscopy, 0000 (24 March 1982); doi: 10.1117/12.933154
Proc. SPIE 0316, Soft X-Ray Sources For The Max-Planck-Institut (MPI) Long Beam (130 M) Test Facility, 0000 (24 March 1982); doi: 10.1117/12.933155
Proc. SPIE 0316, Conference Summary High Resolution Soft X-Ray Optics, 0000 (24 March 1982); doi: 10.1117/12.933156
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