PROCEEDINGS VOLUME 0401
1983 INTERNATIONAL TECHNICAL CONFERENCE/EUROPE | 18-22 APRIL 1983
Thin Film Technologies I
IN THIS VOLUME

0 Sessions, 43 Papers, 0 Presentations
All Papers  (43)
1983 INTERNATIONAL TECHNICAL CONFERENCE/EUROPE
18-22 April 1983
Geneva, Switzerland
All Papers
Proc. SPIE 0401, Applications Of Thin Films In Optics And The Principles And Methods Of Their Design, 0000 (28 November 1983); doi: 10.1117/12.935498
Proc. SPIE 0401, Refractive Index Measurement During The Deposition Of Dielectric Coatings, 0000 (28 November 1983); doi: 10.1117/12.935499
Proc. SPIE 0401, Software For Thin Film Design And Production, 0000 (28 November 1983); doi: 10.1117/12.935500
Proc. SPIE 0401, Physical And Chemical Aspects In The Application Of Thin Films On Optical Elements, 0000 (28 November 1983); doi: 10.1117/12.935501
Proc. SPIE 0401, Strain Of Metal Surfaces Determined By Optical Ellipsometry, 0000 (28 November 1983); doi: 10.1117/12.935503
Proc. SPIE 0401, Mechanical Stresses On Evaporated Chromium Films, 0000 (28 November 1983); doi: 10.1117/12.935504
Proc. SPIE 0401, Monitoring Of Optical Thin Films During Deposition, 0000 (28 November 1983); doi: 10.1117/12.935505
Proc. SPIE 0401, Automated Control Of Optical Layer Fabrication Processes, 0000 (28 November 1983); doi: 10.1117/12.935506
Proc. SPIE 0401, Digital Signal Processing Of Optical Monitoring By Means Of A Kalman Filter, 0000 (28 November 1983); doi: 10.1117/12.935507
Proc. SPIE 0401, Thickness Measurement, Rate Control And Automation In Thin Film Coating Technology, 0000 (28 November 1983); doi: 10.1117/12.935508
Proc. SPIE 0401, Interpretation Of Wide Band Scans Of Growing Optical Thin Films In Terms Of Layer Microstructure, 0000 (28 November 1983); doi: 10.1117/12.935509
Proc. SPIE 0401, Linear Correction Of The Influence Of Thickness Errors During The Evaporation Process, 0000 (28 November 1983); doi: 10.1117/12.935510
Proc. SPIE 0401, Antireflection Coatings Utilizing Multiple Half Waves, 0000 (28 November 1983); doi: 10.1117/12.935511
Proc. SPIE 0401, Broad, Double-Band Antireflection Coatings On Glasses For 1.06µm And Visible Or Ultraviolet Radiation: Design And Experiment, 0000 (28 November 1983); doi: 10.1117/12.935512
Proc. SPIE 0401, Multilayer Antireflection Coatings (ARCs) : A Versatile Method For Design And Optimisation, 0000 (28 November 1983); doi: 10.1117/12.935513
Proc. SPIE 0401, Organic Thin Films In Integrated Optics, 0000 (28 November 1983); doi: 10.1117/12.935514
Proc. SPIE 0401, Preparation Of Planar Optical SiO[sub]2[/sub]-TiO[sub]2[/sub] And LiNbO[sub]3[/sub] Waveguides With A Dip Coating Method And An Embossing Technique For Fabricating Grating Couplers And Channel Waveguides, 0000 (28 November 1983); doi: 10.1117/12.935515
Proc. SPIE 0401, Scattering And Waveguiding Properties Of General Slanted Gratings Consisting Of Anisotrodic Media, 0000 (28 November 1983); doi: 10.1117/12.935516
Proc. SPIE 0401, A Model For Polychromatic Photoresist Exposure In Optical Microlithography, 0000 (28 November 1983); doi: 10.1117/12.935517
Proc. SPIE 0401, Tin Oxide Films On Glass Substrates By A SOL-GEL Technique, 0000 (28 November 1983); doi: 10.1117/12.935518
Proc. SPIE 0401, One Dimensional Linear Refractive Index Profiles From Angular Reflectivity Measurements At One Wavelength, 0000 (28 November 1983); doi: 10.1117/12.935519
Proc. SPIE 0401, Complex Reflectivity And Refractive Index Profiles From Reflectivity Magnitude Measurements, 0000 (28 November 1983); doi: 10.1117/12.935520
Proc. SPIE 0401, Spectrophotometric And Ellipsometric Study Of Leached Layers Formed On Optical Glass By A Diffusion Process, 0000 (28 November 1983); doi: 10.1117/12.935521
Proc. SPIE 0401, Possibilities Of Optically Non Linear Thin Films, 0000 (28 November 1983); doi: 10.1117/12.935522
Proc. SPIE 0401, Replication Technique For Determining The Microroughness Of Large Or Unusually Shaped Optics, 0000 (28 November 1983); doi: 10.1117/12.935523
Proc. SPIE 0401, Angle-Resolved Scattering: Comparison Of Theory And Experiment, 0000 (28 November 1983); doi: 10.1117/12.935524
Proc. SPIE 0401, Physical Aspects Of Laser-Induced Damage Of Optical Coatings, 0000 (28 November 1983); doi: 10.1117/12.935525
Proc. SPIE 0401, Light Scattering From Multilayer Filter Coatings, 0000 (28 November 1983); doi: 10.1117/12.935526
Proc. SPIE 0401, Surface Roughness Assessment Of Ultrasmooth Laser Mirrors And Substrates, 0000 (28 November 1983); doi: 10.1117/12.935527
Proc. SPIE 0401, Ultra-Violet Laser Damage In Aluminium Mirrors, 0000 (28 November 1983); doi: 10.1117/12.935528
Proc. SPIE 0401, High-Rate Sputtering For Optical Purposes, 0000 (28 November 1983); doi: 10.1117/12.935529
Proc. SPIE 0401, The Use Of Ion Implantation For Thin Film Optics, 0000 (28 November 1983); doi: 10.1117/12.935530
Proc. SPIE 0401, Control Of The Optical Properties Of Transparent Conducting Films Prepared By Reactive Magnetron Shuttering, 0000 (28 November 1983); doi: 10.1117/12.935531
Proc. SPIE 0401, Thin Film Deposition Using SOL-GEL Technology, 0000 (28 November 1983); doi: 10.1117/12.935532
Proc. SPIE 0401, The Distribution And Material Usage Efficiency Of Evaporation Sources, 0000 (28 November 1983); doi: 10.1117/12.935533
Proc. SPIE 0401, RF-Plasma Deposition Of Hydrogenated Hard Carbon Thin Films, 0000 (28 November 1983); doi: 10.1117/12.935534
Proc. SPIE 0401, Optical Coatings For Energy Efficiency And Solar Applications: Some Recent Developments, 0000 (28 November 1983); doi: 10.1117/12.935535
Proc. SPIE 0401, Spectrally Selective Solar Absorbing Surfaces. Characteristic Parameters - Measurement Techniques., 0000 (28 November 1983); doi: 10.1117/12.935536
Proc. SPIE 0401, Transparent And Heat Reflecting Coatings, 0000 (28 November 1983); doi: 10.1117/12.935537
Proc. SPIE 0401, Highly Absorbing Coatings Using Graded Refractive Indices And Textured Surfaces, 0000 (28 November 1983); doi: 10.1117/12.935538
Proc. SPIE 0401, Effect Of Roughness On The Selectivity Of Absorbing Surfaces : Application To "Black" Molybdenum Prepared By CVD, 0000 (28 November 1983); doi: 10.1117/12.935539
Proc. SPIE 0401, Thin Transition-Metal Nitride Films With Surface Roughness For Application As Selective Absorbers In Evacuated Solar Collectors, 0000 (28 November 1983); doi: 10.1117/12.935540
Proc. SPIE 0401, Selective Transmission Of Thin TiN-Films, 0000 (28 November 1983); doi: 10.1117/12.935541
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