PROCEEDINGS VOLUME 0447
1983 BROOKHAVEN CONFERENCE: SCIENCE WITH SOFT X-RAYS | 17-19 OCTOBER 1983
Science with Soft X-Rays
IN THIS VOLUME

0 Sessions, 30 Papers, 0 Presentations
All Papers  (30)
1983 BROOKHAVEN CONFERENCE: SCIENCE WITH SOFT X-RAYS
17-19 October 1983
Upton, United States
All Papers
Proc. SPIE 0447, Use Of Undulators In Atomic, Molecular And Solid State Physics, 0000 (27 March 1984); doi: 10.1117/12.939171
Proc. SPIE 0447, Design And Modeling Considerations For SSRL Beam Line Wunder, 0000 (27 March 1984); doi: 10.1117/12.939172
Proc. SPIE 0447, Optimum Undulator Trajectories, 0000 (27 March 1984); doi: 10.1117/12.939173
Proc. SPIE 0447, Performance Of Multilayer Dispersion Elements From 80 To 500 eV, 0000 (27 March 1984); doi: 10.1117/12.939174
Proc. SPIE 0447, Reflectivity And Roughness Of Layered Synthetic Microstructures, 0000 (27 March 1984); doi: 10.1117/12.939175
Proc. SPIE 0447, Core Level Resonances In The Rare Earths Monitored By Electron Energy Loss Spectroscopy, 0000 (27 March 1984); doi: 10.1117/12.939176
Proc. SPIE 0447, Photoemission Studies Of Carbon Overlayers On Nb, 0000 (27 March 1984); doi: 10.1117/12.939177
Proc. SPIE 0447, Surface Atom Core Level Shifts In The Noble Metals, 0000 (27 March 1984); doi: 10.1117/12.939178
Proc. SPIE 0447, Surface Core-Level Shifts In Metals, 0000 (27 March 1984); doi: 10.1117/12.939179
Proc. SPIE 0447, The Surface Electronic Structure Of Gaas(100) And GaAs(111) From Angle Resolved Photoemission, 0000 (27 March 1984); doi: 10.1117/12.939180
Proc. SPIE 0447, Soft X-Ray Emission Spectroscopy Using Synchrotron Light Excitation, 0000 (27 March 1984); doi: 10.1117/12.939181
Proc. SPIE 0447, Possibilities And Limitations Of Spectroscopy In The Ultrasoft X-Ray Region Using The Continuum Of A Conventional X-Ray Tube, 0000 (27 March 1984); doi: 10.1117/12.939182
Proc. SPIE 0447, Photoelectron Diffraction: Present Applications And Future Prospects, 0000 (27 March 1984); doi: 10.1117/12.939183
Proc. SPIE 0447, Angle�Resolved Photoemission Extended Fine Structure, 0000 (27 March 1984); doi: 10.1117/12.939184
Proc. SPIE 0447, Soft X-Ray Photoemission Techniques For Characterizing Metal-Semiconductor Interfaces, 0000 (27 March 1984); doi: 10.1117/12.939185
Proc. SPIE 0447, Surface Structure Determinations From Near Edge X-Ray Absorption Fine Structure Studies, 0000 (27 March 1984); doi: 10.1117/12.939186
Proc. SPIE 0447, Sexafs Studies Of Nickel Silicide Nucleation On Si(111), 0000 (27 March 1984); doi: 10.1117/12.939187
Proc. SPIE 0447, Soft X-Ray Monochromators At Bessy, 0000 (27 March 1984); doi: 10.1117/12.939188
Proc. SPIE 0447, Soft X-Ray Spectroscopics Applied To The Study Of Organic Materials, 0000 (27 March 1984); doi: 10.1117/12.939189
Proc. SPIE 0447, Relaxation And Localization Of Photogenerated Charges In Organic Solids, 0000 (27 March 1984); doi: 10.1117/12.939190
Proc. SPIE 0447, Gas Phase Spectroscopy Near The Carbon K-Edge, 0000 (27 March 1984); doi: 10.1117/12.939191
Proc. SPIE 0447, Gas-Phase Photoemission With Soft X-Rays: Cross Sections And Angular Distributions, 0000 (27 March 1984); doi: 10.1117/12.939192
Proc. SPIE 0447, Scanning Soft X-Ray Microscopy With A Fresnel Zoneplate At The National Synchrotron Light Source, 0000 (27 March 1984); doi: 10.1117/12.939193
Proc. SPIE 0447, Possibilities For The Study Of Blood Platelets Using Soft X-Ray Microscopy, 0000 (27 March 1984); doi: 10.1117/12.939194
Proc. SPIE 0447, Soft X-Rays As A Tool To Investigate Radiation-Sensitive Sites In Mammalian Cells, 0000 (27 March 1984); doi: 10.1117/12.939195
Proc. SPIE 0447, Line Source X-Ray Microscopy, 0000 (27 March 1984); doi: 10.1117/12.939196
Proc. SPIE 0447, Soft X-Ray Imaging Of Hydrated Biological Specimens, 0000 (27 March 1984); doi: 10.1117/12.939197
Proc. SPIE 0447, On The Possibility Of Measuring The Diffraction Pattern Of Single Micro Objects, 0000 (27 March 1984); doi: 10.1117/12.939198
Proc. SPIE 0447, X-Ray Holographic Microscopy Experiments At The Brookhaven Synchrotron Light Source, 0000 (27 March 1984); doi: 10.1117/12.939199
Proc. SPIE 0447, Electron Beam Fabrication And Characterization Of Fresnel Zone Plates For Soft X-Ray Microscopy, 0000 (27 March 1984); doi: 10.1117/12.939200
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