PROCEEDINGS VOLUME 0476
1984 TECHNICAL SYMPOSIUM EAST | 1-4 MAY 1984
Excimer Lasers: Their Applications & New Frontiers in Lasers
IN THIS VOLUME

0 Sessions, 21 Papers, 0 Presentations
All Papers  (21)
1984 TECHNICAL SYMPOSIUM EAST
1-4 May 1984
Arlington, United States
All Papers
Proc. SPIE 0476, Progress On The Scaling Of The X-Ray Preionized Discharge Pumped Xec1 Laser, 0000 (15 August 1984); doi: 10.1117/12.942565
Proc. SPIE 0476, Novel Operational Regime Of High-Efficiency KrF Lasers, 0000 (15 August 1984); doi: 10.1117/12.942566
Proc. SPIE 0476, Ultrashort Pulses From Excimer Lasers, 0000 (15 August 1984); doi: 10.1117/12.942567
Proc. SPIE 0476, Optimization Of Broadband Electrically Excited Excimer Lasers, 0000 (15 August 1984); doi: 10.1117/12.942568
Proc. SPIE 0476, Multi-Dimensional Modeling Of Hgbr Electric Discharge Lasers, 0000 (15 August 1984); doi: 10.1117/12.942569
Proc. SPIE 0476, I2 Amplifier In The Green, 0000 (15 August 1984); doi: 10.1117/12.942570
Proc. SPIE 0476, Experimental Study Of The Triatomic Excimer Kr2F Laser, 0000 (15 August 1984); doi: 10.1117/12.942571
Proc. SPIE 0476, Transient Gain And Absorption Measurements In Electron Beam Pumped Helium And Helium/Halogen Mixtures, 0000 (15 August 1984); doi: 10.1117/12.942572
Proc. SPIE 0476, Multiphoton Ionization And Short Wavelength Stimulated Emission Using Excimer Lasers, 0000 (15 August 1984); doi: 10.1117/12.942573
Proc. SPIE 0476, Photoemission Apparatus Using Xuv Harmonics Of A Picosecond KrF Laser, 0000 (15 August 1984); doi: 10.1117/12.942574
Proc. SPIE 0476, Generation Of Mj Pulses At 117 Nm By Frequency Conversion Of XeF Laser Radiation, 0000 (15 August 1984); doi: 10.1117/12.942575
Proc. SPIE 0476, Applications Of Excimer Laser Phase Conjugate Mirror, 0000 (15 August 1984); doi: 10.1117/12.942576
Proc. SPIE 0476, Use Of Stimulated Raman Scattering For Reducing The Divergence Of Severely Aberrated Laser Beams, 0000 (15 August 1984); doi: 10.1117/12.942577
Proc. SPIE 0476, Gas Immersion Laser Doping, 0000 (15 August 1984); doi: 10.1117/12.942578
Proc. SPIE 0476, Excimer Laser Enhancement And Probing Of 111-V Compound Semiconductor Chemical Vapor Deposition, 0000 (15 August 1984); doi: 10.1117/12.942579
Proc. SPIE 0476, Review Of Impulse Coupling With Materials, 0000 (15 August 1984); doi: 10.1117/12.942580
Proc. SPIE 0476, Coupling Of Pulsed 0.35 Micron Laser Radiation To Metal Surfaces In Vacuum, 0000 (15 August 1984); doi: 10.1117/12.942581
Proc. SPIE 0476, Overview Of Coating Techniques, 0000 (15 August 1984); doi: 10.1117/12.942582
Proc. SPIE 0476, Photothermal Deflection Analysis Of Uv Optical Thin Films, 0000 (15 August 1984); doi: 10.1117/12.942583
Proc. SPIE 0476, Review Of Ultraviolet Damage Threshold Measurements At Lawrence Livermore National Laboratory, 0000 (15 August 1984); doi: 10.1117/12.942584
Proc. SPIE 0476, Optical Coating Materials For The Ultraviolet - Selection And Characterization, 0000 (15 August 1984); doi: 10.1117/12.942586
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