PROCEEDINGS VOLUME 0520
1984 CAMBRIDGE SYMPOSIUM | 23-26 OCTOBER 1984
Thermosense VII: Thermal Infrared Sensing for Diagnostics and Control
IN THIS VOLUME

0 Sessions, 35 Papers, 0 Presentations
All Papers  (35)
1984 CAMBRIDGE SYMPOSIUM
23-26 October 1984
Cambridge, United States
All Papers
Proc. SPIE 0520, Principles Of Calibration For Radiometric Temperature Measurements, 0000 (20 March 1985); doi: 10.1117/12.946122
Proc. SPIE 0520, The Technologist As An Expert Witness, 0000 (20 March 1985); doi: 10.1117/12.946123
Proc. SPIE 0520, Infrared Thermography And The Expert Witness, 0000 (20 March 1985); doi: 10.1117/12.946124
Proc. SPIE 0520, Infrared (IR) Transmitting Materials, 0000 (20 March 1985); doi: 10.1117/12.946125
Proc. SPIE 0520, Microprocessor Based Radiation Sources And Radiometers For Testing Thermal Imaging Systems, 0000 (20 March 1985); doi: 10.1117/12.946126
Proc. SPIE 0520, Cavity Emissivities Greater Than One, 0000 (20 March 1985); doi: 10.1117/12.946127
Proc. SPIE 0520, A Proposed Model For Thermal Image Scene Analysis, 0000 (20 March 1985); doi: 10.1117/12.946128
Proc. SPIE 0520, An Improved Method Of Multi-Wavelenth Pyrometry, 0000 (20 March 1985); doi: 10.1117/12.946129
Proc. SPIE 0520, Fast Times At High Temperatures, 0000 (20 March 1985); doi: 10.1117/12.946130
Proc. SPIE 0520, Test Of Jet Engine Turbine Blades By Thermography, 0000 (20 March 1985); doi: 10.1117/12.946131
Proc. SPIE 0520, Surface Temperature Of A Solar Array Under Simulated Failure Modes In Orbital Conditions, 0000 (20 March 1985); doi: 10.1117/12.946132
Proc. SPIE 0520, The Application Of Infrared Thermography To Solar Central Receiver Temperature Measurements Part I. Instrument Evaluation, 0000 (20 March 1985); doi: 10.1117/12.946133
Proc. SPIE 0520, The Application Of Infrared Thermographs To Solar Central Receiver Temperature Measurements Part II Receiver Evaluation, 0000 (20 March 1985); doi: 10.1117/12.946134
Proc. SPIE 0520, Thermographic Studies Of Catalytic Reactions, 0000 (20 March 1985); doi: 10.1117/12.946135
Proc. SPIE 0520, Thermographic Evaluation Of Bond Lines And Material Consistancy Of Composites, 0000 (20 March 1985); doi: 10.1117/12.946136
Proc. SPIE 0520, Materials Characterization By Thermographic Imaging, 0000 (20 March 1985); doi: 10.1117/12.946137
Proc. SPIE 0520, Characterization Of The Heat Source Distribution Of A Typical Gtaw Welding Arc, 0000 (20 March 1985); doi: 10.1117/12.946138
Proc. SPIE 0520, Microwave Measurement For Wavefront Reconstruction Via Infrared Detection, 0000 (20 March 1985); doi: 10.1117/12.946139
Proc. SPIE 0520, Steam Dynamics - Traps And Coils, 0000 (20 March 1985); doi: 10.1117/12.946140
Proc. SPIE 0520, The Non-Destructive Evaluation Of Composites And Other Materials By Thermal Pulse Video Thermography, 0000 (20 March 1985); doi: 10.1117/12.946141
Proc. SPIE 0520, Evaluation Of Dynamic Temperature Distribution With Thermography, 0000 (20 March 1985); doi: 10.1117/12.946142
Proc. SPIE 0520, Evaluation Of Photovoltaic Panels With Ir Thermography, 0000 (20 March 1985); doi: 10.1117/12.946143
Proc. SPIE 0520, Thermal Stress Analysis Of Brake System Components, 0000 (20 March 1985); doi: 10.1117/12.946144
Proc. SPIE 0520, Applications Of Real-Time Thermography For Nondestructive Testing Of Composites, 0000 (20 March 1985); doi: 10.1117/12.946145
Proc. SPIE 0520, Thermal Profiles Of Thermite Reactions, 0000 (20 March 1985); doi: 10.1117/12.946146
Proc. SPIE 0520, Infrared Thermography Of Burn Front Propagation In Heat Powders, 0000 (20 March 1985); doi: 10.1117/12.946147
Proc. SPIE 0520, Manufacturing Technology For A High Resolution Real Time Infrared System For Printed Wiring Assemblies Testing, 0000 (20 March 1985); doi: 10.1117/12.946148
Proc. SPIE 0520, A New Generation Of Infrared Thermometers, 0000 (20 March 1985); doi: 10.1117/12.946149
Proc. SPIE 0520, Application Of Non-Contact Infrared Thermometers And Infrared Scanners To Large Active Solar Systems, 0000 (20 March 1985); doi: 10.1117/12.946150
Proc. SPIE 0520, Aerial Thermography And Spot Radiometer Applications For Detecting Thermal Anomalies Of Office Buildings, 0000 (20 March 1985); doi: 10.1117/12.946151
Proc. SPIE 0520, Residential Thermal Anomalies And Their Origins, 0000 (20 March 1985); doi: 10.1117/12.946152
Proc. SPIE 0520, Economics Of Thermographic Predictive Maintenance Inspections, 0000 (20 March 1985); doi: 10.1117/12.946153
Proc. SPIE 0520, Location Of Reinforcement By Induction-Thermography, 0000 (20 March 1985); doi: 10.1117/12.946154
Proc. SPIE 0520, Thermography As A Diagnostic Tool In Building Engineering, 0000 (20 March 1985); doi: 10.1117/12.946155
Proc. SPIE 0520, Industrial Thermographic Process Monitoring And Control: A New Modular, Line-Scanning Concept For Continuous Temperature Measurement., 0000 (20 March 1985); doi: 10.1117/12.946156
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