PROCEEDINGS VOLUME 0525
1985 LOS ANGELES TECHNICAL SYMPOSIUM | 21-25 JANUARY 1985
Measurement and Effects of Surface Defects & Quality of Polish
IN THIS VOLUME

0 Sessions, 26 Papers, 0 Presentations
All Papers  (26)
1985 LOS ANGELES TECHNICAL SYMPOSIUM
21-25 January 1985
Los Angeles, United States
All Papers
Proc. SPIE 0525, Surface Roughness Metrology By Angular Distributions Of Scattered Light, 0000 (3 September 1985); doi: 10.1117/12.946338
Proc. SPIE 0525, Defects Induced In Optical Surfaces By The Diamond-Turning Process, 0000 (3 September 1985); doi: 10.1117/12.946339
Proc. SPIE 0525, Image Degradation Caused By Tooling Marks In Diamond-Turned Optics, 0000 (3 September 1985); doi: 10.1117/12.946340
Proc. SPIE 0525, The Specification And Control Of Surface Finish-Empiricism Versus Dogmatism, 0000 (3 September 1985); doi: 10.1117/12.946341
Proc. SPIE 0525, Visibility Method To Classify Macroscopic Surface Defects For Both Reflection And Transmission Systems., 0000 (3 September 1985); doi: 10.1117/12.946342
Proc. SPIE 0525, Defect Characteristics Of Optical Surfaces Using Pulsed Laser Damage Methods, 0000 (3 September 1985); doi: 10.1117/12.946343
Proc. SPIE 0525, Nondestructive Defect Detection From Optical Surfaces, 0000 (3 September 1985); doi: 10.1117/12.946344
Proc. SPIE 0525, ASTM And OSA Efforts To Develop An Optical Surface Roughness Measurement Standard, 0000 (3 September 1985); doi: 10.1117/12.946345
Proc. SPIE 0525, Comparison Of Visibility Of Standard Scratches, 0000 (3 September 1985); doi: 10.1117/12.946346
Proc. SPIE 0525, Tunable Scratch Standards, 0000 (3 September 1985); doi: 10.1117/12.946347
Proc. SPIE 0525, Use Of MIL-0-13830A For Specifying The Surface Quality Of Laser Optics, 0000 (3 September 1985); doi: 10.1117/12.946348
Proc. SPIE 0525, Effect Of Defects And Surface Finish On The Performance Of Optical Systems, 0000 (3 September 1985); doi: 10.1117/12.946349
Proc. SPIE 0525, Effects Of Surface Quality On CO[sub]2[/sub] Optics, 0000 (3 September 1985); doi: 10.1117/12.946350
Proc. SPIE 0525, Surface Quality Requirements And Inspection Techniques For Semiconductor Slices, 0000 (3 September 1985); doi: 10.1117/12.946351
Proc. SPIE 0525, Instrumentation For Measuring Finish, Defects And Gloss, 0000 (3 September 1985); doi: 10.1117/12.946352
Proc. SPIE 0525, Application Of IR Ellipsometry/Reflectometry To Surface Metrology, 0000 (3 September 1985); doi: 10.1117/12.946353
Proc. SPIE 0525, Scanning Electron Microscopy Studies Of Laser Damage Initiating Defects In ZnSe/ThF[sub]4[/sub] And SiH/Si0[sub]2[/sub] Multilayer Coatings, 0000 (3 September 1985); doi: 10.1117/12.946354
Proc. SPIE 0525, A Study Of Surface Particulate Contamination On The Primary Mirror Of The Hubble Space Telescope, 0000 (3 September 1985); doi: 10.1117/12.946355
Proc. SPIE 0525, Laser Scattering From Multi-Scale Surfaces, 0000 (3 September 1985); doi: 10.1117/12.946356
Proc. SPIE 0525, Measurement Of Roughness On Teeth By Means Of Holographic Correlation., 0000 (3 September 1985); doi: 10.1117/12.946357
Proc. SPIE 0525, A Portable Scatterometer For Optical Shop Use, 0000 (3 September 1985); doi: 10.1117/12.946358
Proc. SPIE 0525, A Schlieren Microscope, 0000 (3 September 1985); doi: 10.1117/12.946359
Proc. SPIE 0525, Microprofiling Of Precision Surfaces, 0000 (3 September 1985); doi: 10.1117/12.946360
Proc. SPIE 0525, Optical Profilers For Surface Roughness, 0000 (3 September 1985); doi: 10.1117/12.946361
Proc. SPIE 0525, Scatter Measurements Made With Ultraviolet Light, 0000 (3 September 1985); doi: 10.1117/12.946362
Proc. SPIE 0525, Instrument For Angle-Resolved Measurement Of Scattered Light In The VUV-Visible Wavelength Region, 0000 (3 September 1985); doi: 10.1117/12.946363
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