PROCEEDINGS VOLUME 0599
1985 INTERNATIONAL TECHNICAL SYMPOSIUM/EUROPE | 25-27 NOVEMBER 1985
Optics in Engineering Measurement
IN THIS VOLUME

0 Sessions, 71 Papers, 0 Presentations
All Papers  (71)
1985 INTERNATIONAL TECHNICAL SYMPOSIUM/EUROPE
25-27 November 1985
Cannes, France
All Papers
Proc. SPIE 0599, Optical Methods In Engineering Measurements, 0000 (16 July 1986); doi: 10.1117/12.952346
Proc. SPIE 0599, Use Of Projected Holographic Images For Automatic Inspection In Hostile Environments, 0000 (16 July 1986); doi: 10.1117/12.952347
Proc. SPIE 0599, Holography Of Semi-Transparent Spherical Droplets, 0000 (16 July 1986); doi: 10.1117/12.952348
Proc. SPIE 0599, Applications Of Optical Holography To Underwater Visual Inspection, 0000 (16 July 1986); doi: 10.1117/12.952349
Proc. SPIE 0599, Contribution Of Holographic Interferometry To The Numerical Simulation Of Concrete Shrinkage, 0000 (16 July 1986); doi: 10.1117/12.952350
Proc. SPIE 0599, Adjustment Of Sonotrodes By Holographic Interferometry, 0000 (16 July 1986); doi: 10.1117/12.952351
Proc. SPIE 0599, Holographic Non-Destructive Testing For Composite Materials Used In Aerospace, 0000 (16 July 1986); doi: 10.1117/12.952352
Proc. SPIE 0599, Holographic And Finite Element Studies Of Vibrating Beams, 0000 (16 July 1986); doi: 10.1117/12.952353
Proc. SPIE 0599, Investigation Of Integrated Circuits By Holographic Technique, 0000 (16 July 1986); doi: 10.1117/12.952354
Proc. SPIE 0599, Holographic Interferometry Of Rotating Components: Decorrelation Limitations Of The Double Pulsed Technique, 0000 (16 July 1986); doi: 10.1117/12.952355
Proc. SPIE 0599, Vibratory Analysis Of A Rotating Bladed Disk Using Holographic Interferometry And Laser Vibrometry, 0000 (16 July 1986); doi: 10.1117/12.952356
Proc. SPIE 0599, Holographic Testing Of Stretchable Concave Imaging Mirrors, 0000 (16 July 1986); doi: 10.1117/12.952357
Proc. SPIE 0599, Application Of Holographic Contouring To Materials Testing, 0000 (16 July 1986); doi: 10.1117/12.952358
Proc. SPIE 0599, Holographic Applications Of Computer-Based Fringe Interpretation, 0000 (16 July 1986); doi: 10.1117/12.952359
Proc. SPIE 0599, Sandwich Hologram: A Practical Tool For Stress Analysis In Paintings On Canvas., 0000 (16 July 1986); doi: 10.1117/12.952360
Proc. SPIE 0599, Holographic Flow Visualisation Applied To Very Small Flow Sections In Turbomachinery Research, 0000 (16 July 1986); doi: 10.1117/12.952361
Proc. SPIE 0599, Application Of Great Depth Holographic Technique To Double-Exposure Holographic Interferometry, 0000 (16 July 1986); doi: 10.1117/12.952362
Proc. SPIE 0599, Measurement Of Deformation Of Loaded Track By White Light Speckle Method, 0000 (16 July 1986); doi: 10.1117/12.952363
Proc. SPIE 0599, New Developments In Computer-Aided Holography, 0000 (16 July 1986); doi: 10.1117/12.952364
Proc. SPIE 0599, Automatic Fringe Analysis In Double Exposure And Live Fringe Holographic Interferometry, 0000 (16 July 1986); doi: 10.1117/12.952365
Proc. SPIE 0599, Automated Evaluation Of 3-D Displacement And Strain By Quasi-Heterodyne Holographic Interferometry, 0000 (16 July 1986); doi: 10.1117/12.952366
Proc. SPIE 0599, Phase Shifting Holographic Interferometry (PSHI), 0000 (16 July 1986); doi: 10.1117/12.952367
Proc. SPIE 0599, A System for the Quantitative Analysis of Interferograms, 0000 (16 July 1986); doi: 10.1117/12.952368
Proc. SPIE 0599, Interferogram Analysis By Means Of A Photodiode Array, 0000 (16 July 1986); doi: 10.1117/12.952369
Proc. SPIE 0599, Stroboscopic Laser Speckle Interferometry Used for Measuring Dynamic Behaviour of Structures, 0000 (16 July 1986); doi: 10.1117/12.952370
Proc. SPIE 0599, Pulsed Laser ESPI Applied to Particular Rotating Component Problems, 0000 (16 July 1986); doi: 10.1117/12.952371
Proc. SPIE 0599, Advancement Of Optical Non-Destructive Testing In China, 0000 (16 July 1986); doi: 10.1117/12.952372
Proc. SPIE 0599, Application Of Pulsed Holography And Double Pulsed Electronic Speckle Pattern Interferometry To Large Vibrating Engineering Structures, 0000 (16 July 1986); doi: 10.1117/12.952373
Proc. SPIE 0599, Contouring by Electronic speckle Pattern Interferometry (ESPI), 0000 (16 July 1986); doi: 10.1117/12.952374
Proc. SPIE 0599, The Application Of Holospeckle-Shearing Interferometry To Displacement And Slope Analysis Of A Diaphragm Used In Silicon Pressure Sensors, 0000 (16 July 1986); doi: 10.1117/12.952375
Proc. SPIE 0599, Contrast Enhancement Of ESPI Vibration Patterns By Speckle Averaging In A Video Frame Store, 0000 (16 July 1986); doi: 10.1117/12.952376
Proc. SPIE 0599, Measuring 3-D Displacement Of A Surface Using The White Light Speckle Technique, 0000 (16 July 1986); doi: 10.1117/12.952377
Proc. SPIE 0599, Investigation Into The Crack Development And Joint Rotation Of Reinforced Concrete Structures, 0000 (16 July 1986); doi: 10.1117/12.952378
Proc. SPIE 0599, Measurement Of Residual Stresses By Modern Optical Methods (II), 0000 (16 July 1986); doi: 10.1117/12.952379
Proc. SPIE 0599, Measurement Of Elastic Modulus Of Human Dentin And Supporting Bone By Laser Speckle Photography, 0000 (16 July 1986); doi: 10.1117/12.952380
Proc. SPIE 0599, Electronic Speckle Pattern Interferometer (ESPI) Fringe Manipulation, 0000 (16 July 1986); doi: 10.1117/12.952381
Proc. SPIE 0599, Laser Speckle Velocimetry Applied To Rayleigh-Benard Convection, 0000 (16 July 1986); doi: 10.1117/12.952382
Proc. SPIE 0599, Novel Applications Of MTF Measurements Using Moire Deflectometry, 0000 (16 July 1986); doi: 10.1117/12.952383
Proc. SPIE 0599, Application Of Grating Methods For Testing Of Material And Quality Control Including Digital Image Processing, 0000 (16 July 1986); doi: 10.1117/12.952384
Proc. SPIE 0599, Effects Of Spatial Coherence Of Light Sources And Grating Gaps On The Quality Of Moire Signal Of Linear Grating Sensors, 0000 (16 July 1986); doi: 10.1117/12.952385
Proc. SPIE 0599, Mass Transfer Measurement Using Projected Fringes, 0000 (16 July 1986); doi: 10.1117/12.952386
Proc. SPIE 0599, Multichannel Grating Phase-Shift Interferometers, 0000 (16 July 1986); doi: 10.1117/12.952387
Proc. SPIE 0599, The Influences Of Several Parameters Of Grating Sensor On The Modulation Depth Of Moire Signal Under Incoherent Illumination, 0000 (16 July 1986); doi: 10.1117/12.952388
Proc. SPIE 0599, Fiber Optic Whole-Circum Sensor To Improve The Accuracy Of Radial Grating Measurement Systems, 0000 (16 July 1986); doi: 10.1117/12.952389
Proc. SPIE 0599, A Novel Method For Evaluating The Resolution And The Wavefront Of Plane Diffraction Grating With FFT, 0000 (16 July 1986); doi: 10.1117/12.952390
Proc. SPIE 0599, Three-Dimensional Surface Metrology Using A Computer-Controlled Non-Contact Instrument, 0000 (16 July 1986); doi: 10.1117/12.952391
Proc. SPIE 0599, A Review Of Optical Techniques For The Measurement Of Surface Geometries, 0000 (16 July 1986); doi: 10.1117/12.952392
Proc. SPIE 0599, The Application Of Phase Detection Technique Used In The Ultra-Precision Surface Flatness Measurement, 0000 (16 July 1986); doi: 10.1117/12.952393
Proc. SPIE 0599, Recognizing Kinds Of Surface Defects In A Workpiece By Dynamic Optical Matrix Method, 0000 (16 July 1986); doi: 10.1117/12.952394
Proc. SPIE 0599, Some Optical Test Methods Used In Performance Evaluation Of HIPPARCOS Telescope, 0000 (16 July 1986); doi: 10.1117/12.952395
Proc. SPIE 0599, Photogrammetric Prototype System For Real-Time Engineering Applications, 0000 (16 July 1986); doi: 10.1117/12.952396
Proc. SPIE 0599, Photogrammetry Applied To Nuclear Reactor Inspection, 0000 (16 July 1986); doi: 10.1117/12.952397
Proc. SPIE 0599, Some Recent Developments In The Field Of Optical Testing Techniques, 0000 (16 July 1986); doi: 10.1117/12.952398
Proc. SPIE 0599, Application Of Ultrashort Light Pulses For High-Precision Measurements In Atoms, 0000 (16 July 1986); doi: 10.1117/12.952399
Proc. SPIE 0599, Laser-Based Measurement Of Torsional Vibration, 0000 (16 July 1986); doi: 10.1117/12.952400
Proc. SPIE 0599, Thin Plate Counting Device, 0000 (16 July 1986); doi: 10.1117/12.952401
Proc. SPIE 0599, Laser Shadow Method For Measuring The Diameter Of A Transparent Filament, 0000 (16 July 1986); doi: 10.1117/12.952402
Proc. SPIE 0599, Measurement in a Low-Pressure Plasma Jet with a Laser Dual Focus Velocimeter (L2F), 0000 (16 July 1986); doi: 10.1117/12.952403
Proc. SPIE 0599, Acceleration Measurements Using Laser Doppler Anemometry, 0000 (16 July 1986); doi: 10.1117/12.952404
Proc. SPIE 0599, Fiber-Optic Interferometer And Its Application For Photographic Materials Testing, 0000 (16 July 1986); doi: 10.1117/12.952405
Proc. SPIE 0599, A Laser Doppler Vibrometer, 0000 (16 July 1986); doi: 10.1117/12.952406