PROCEEDINGS VOLUME 0645
1986 TECHNICAL SYMPOSIUM SOUTHEAST | 1-4 APRIL 1986
Optical Manufacturing, Testing and Aspheric Optics
IN THIS VOLUME

0 Sessions, 22 Papers, 0 Presentations
All Papers  (22)
1986 TECHNICAL SYMPOSIUM SOUTHEAST
1-4 April 1986
Orlando, United States
All Papers
Proc. SPIE 0645, Scanning Aspherical Surfaces With The Focus-Wavelength Encoded Profilometer, 0000 (3 November 1986); doi: 10.1117/12.964477
Proc. SPIE 0645, Test And Measuring Methods To Analyse Undulation Effects On Micromachined Optical Surfaces Generated By Vibration On Precision Machinery, 0000 (3 November 1986); doi: 10.1117/12.964478
Proc. SPIE 0645, Verifying Nd-Tool Quality Using Plunge Cuts And Micro-Interferometer, 0000 (3 November 1986); doi: 10.1117/12.964479
Proc. SPIE 0645, "Predicting And Minimizing Working Zone Migration On Nd-Tools Used In Aspherical Micromachining With The Erickson-Watt Approach"., 0000 (3 November 1986); doi: 10.1117/12.964480
Proc. SPIE 0645, About Very Large Air-Bearing Tables (3M O.D.) For Micromachining Of Aspherical And Fresnel Mirrors., 0000 (3 November 1986); doi: 10.1117/12.964481
Proc. SPIE 0645, In Process Measurement Of Radii Of Curvature On Micromachined Spherical Zones, 0000 (3 November 1986); doi: 10.1117/12.964482
Proc. SPIE 0645, Diamond Turning With Moore Machine For Infra-Red Applications. Machining And Results., 0000 (3 November 1986); doi: 10.1117/12.964483
Proc. SPIE 0645, Mass-Production Of Diffraction Limited Replicated Objective Lenses For Compact-Disc Players., 0000 (3 November 1986); doi: 10.1117/12.964484
Proc. SPIE 0645, Design And Measurement Of Replicated Aspheric Compact Disc Objective Lenses, 0000 (3 November 1986); doi: 10.1117/12.964485
Proc. SPIE 0645, A Replicated Bi-Aspherical Readout Lens For Optical Disc Systems., 0000 (3 November 1986); doi: 10.1117/12.964486
Proc. SPIE 0645, Aspects Of Manufacturing Grazing Incidence X-Ray Mirrors, 0000 (3 November 1986); doi: 10.1117/12.964487
Proc. SPIE 0645, An Automated Aspheric Polishing Machine, 0000 (3 November 1986); doi: 10.1117/12.964488
Proc. SPIE 0645, Direct Contact Profilometry Of Large Aspherics, 0000 (3 November 1986); doi: 10.1117/12.964489
Proc. SPIE 0645, The Use Of Perturbed Aspherics In Broad Band Optical Systems, 0000 (3 November 1986); doi: 10.1117/12.964490
Proc. SPIE 0645, High Power Laser Focusing Optics, 0000 (3 November 1986); doi: 10.1117/12.964491
Proc. SPIE 0645, Multiple Aspheric Systems For The Lithography Of VLSI Circuits, 0000 (3 November 1986); doi: 10.1117/12.964492
Proc. SPIE 0645, A New Test For Cylindrical Optics, 0000 (3 November 1986); doi: 10.1117/12.964493
Proc. SPIE 0645, Direct Phase Measurement Of Aspheric Surface Contours, 0000 (3 November 1986); doi: 10.1117/12.964494
Proc. SPIE 0645, Statistical And Signal Processing Concepts In Surface Metrology, 0000 (3 November 1986); doi: 10.1117/12.964495
Proc. SPIE 0645, Temperature Stable Boresight Module, 0000 (3 November 1986); doi: 10.1117/12.964496
Proc. SPIE 0645, Surface Roughness Effect On Laser Speckle Spectral Density, 0000 (3 November 1986); doi: 10.1117/12.964497
Proc. SPIE 0645, An Optical Lever For The Metrology Of Grazing Incidence Optics, 0000 (3 November 1986); doi: 10.1117/12.964498
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