Optical Manufacturing, Testing and Aspheric Optics

0 Sessions, 22 Papers, 0 Presentations
All Papers  (22)
1-4 April 1986
Orlando, United States
All Papers
Proc. SPIE 0645, Scanning Aspherical Surfaces With The Focus-Wavelength Encoded Profilometer, (3 November 1986);doi: 10.1117/12.964477
Proc. SPIE 0645, Test And Measuring Methods To Analyse Undulation Effects On Micromachined Optical Surfaces Generated By Vibration On Precision Machinery, (3 November 1986);doi: 10.1117/12.964478
Proc. SPIE 0645, Verifying Nd-Tool Quality Using Plunge Cuts And Micro-Interferometer, (3 November 1986);doi: 10.1117/12.964479
Proc. SPIE 0645, "Predicting And Minimizing Working Zone Migration On Nd-Tools Used In Aspherical Micromachining With The Erickson-Watt Approach"., (3 November 1986);doi: 10.1117/12.964480
Proc. SPIE 0645, About Very Large Air-Bearing Tables (3M O.D.) For Micromachining Of Aspherical And Fresnel Mirrors., (3 November 1986);doi: 10.1117/12.964481
Proc. SPIE 0645, In Process Measurement Of Radii Of Curvature On Micromachined Spherical Zones, (3 November 1986);doi: 10.1117/12.964482
Proc. SPIE 0645, Diamond Turning With Moore Machine For Infra-Red Applications. Machining And Results., (3 November 1986);doi: 10.1117/12.964483
Proc. SPIE 0645, Mass-Production Of Diffraction Limited Replicated Objective Lenses For Compact-Disc Players., (3 November 1986);doi: 10.1117/12.964484
Proc. SPIE 0645, Design And Measurement Of Replicated Aspheric Compact Disc Objective Lenses, (3 November 1986);doi: 10.1117/12.964485
Proc. SPIE 0645, A Replicated Bi-Aspherical Readout Lens For Optical Disc Systems., (3 November 1986);doi: 10.1117/12.964486
Proc. SPIE 0645, Aspects Of Manufacturing Grazing Incidence X-Ray Mirrors, (3 November 1986);doi: 10.1117/12.964487
Proc. SPIE 0645, An Automated Aspheric Polishing Machine, (3 November 1986);doi: 10.1117/12.964488
Proc. SPIE 0645, Direct Contact Profilometry Of Large Aspherics, (3 November 1986);doi: 10.1117/12.964489
Proc. SPIE 0645, The Use Of Perturbed Aspherics In Broad Band Optical Systems, (3 November 1986);doi: 10.1117/12.964490
Proc. SPIE 0645, High Power Laser Focusing Optics, (3 November 1986);doi: 10.1117/12.964491
Proc. SPIE 0645, Multiple Aspheric Systems For The Lithography Of VLSI Circuits, (3 November 1986);doi: 10.1117/12.964492
Proc. SPIE 0645, A New Test For Cylindrical Optics, (3 November 1986);doi: 10.1117/12.964493
Proc. SPIE 0645, Direct Phase Measurement Of Aspheric Surface Contours, (3 November 1986);doi: 10.1117/12.964494
Proc. SPIE 0645, Statistical And Signal Processing Concepts In Surface Metrology, (3 November 1986);doi: 10.1117/12.964495
Proc. SPIE 0645, Temperature Stable Boresight Module, (3 November 1986);doi: 10.1117/12.964496
Proc. SPIE 0645, Surface Roughness Effect On Laser Speckle Spectral Density, (3 November 1986);doi: 10.1117/12.964497
Proc. SPIE 0645, An Optical Lever For The Metrology Of Grazing Incidence Optics, (3 November 1986);doi: 10.1117/12.964498
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