PROCEEDINGS VOLUME 0652
1986 INTERNATIONAL SYMPOSIUM/INNSBRUCK | 15-18 APRIL 1986
Thin Film Technologies II
IN THIS VOLUME

0 Sessions, 50 Papers, 0 Presentations
All Papers  (50)
1986 INTERNATIONAL SYMPOSIUM/INNSBRUCK
15-18 April 1986
Innsbruck, Austria
All Papers
Proc. SPIE 0652, Automated Optical Coating Processes With Optical Thickness Monitoring, 0000 (13 October 1986); doi: 10.1117/12.938350
Proc. SPIE 0652, Thin Film Production With A New Fully Automated Optical Thickness Monitoring System, 0000 (13 October 1986); doi: 10.1117/12.938351
Proc. SPIE 0652, An Evaporation Monitoring System featuring "Software" Trigger Points and On line Evaluation of Refractive Indices, 0000 (13 October 1986); doi: 10.1117/12.938352
Proc. SPIE 0652, Optical Monitoring: Comparison Of Different Monitoring Strategies With Respect To The Resulting Reproducibility To The Completed Layer Systems, 0000 (13 October 1986); doi: 10.1117/12.938353
Proc. SPIE 0652, Realization Of Fabry-Perot Filters For Wavelength Demultiplexing, 0000 (13 October 1986); doi: 10.1117/12.938354
Proc. SPIE 0652, Ultrasonic Precision Cleaning Of Optical Components Prior To And After Vacuum Coating, 0000 (13 October 1986); doi: 10.1117/12.938355
Proc. SPIE 0652, Survey Of Computer Numerically Controlled Optical Coating Systems, 0000 (13 October 1986); doi: 10.1117/12.938356
Proc. SPIE 0652, Design Of Optical Multilayer Coatings At NRCC, 0000 (13 October 1986); doi: 10.1117/12.938357
Proc. SPIE 0652, Tschebyshev Optical Filter Design, 0000 (13 October 1986); doi: 10.1117/12.938358
Proc. SPIE 0652, Wideband Antireflection Coating Design By The Random Search Approach, 0000 (13 October 1986); doi: 10.1117/12.938359
Proc. SPIE 0652, Medium-Index Mixed-Oxide Layers for Use in AR-Coatings, 0000 (13 October 1986); doi: 10.1117/12.938360
Proc. SPIE 0652, Computer Aided Design (CAD) Of Thin Film Optical Coatings, 0000 (13 October 1986); doi: 10.1117/12.938361
Proc. SPIE 0652, Systems Analysis Of Absorbing Media, 0000 (13 October 1986); doi: 10.1117/12.938362
Proc. SPIE 0652, Algorithms for Optical Thin Film Software, 0000 (13 October 1986); doi: 10.1117/12.938363
Proc. SPIE 0652, The Use Of An IBM PC For Maximizing Production In Coating Laboratories, 0000 (13 October 1986); doi: 10.1117/12.938364
Proc. SPIE 0652, Subjective Versus Objective Methods For Surface Inspection, 0000 (13 October 1986); doi: 10.1117/12.938365
Proc. SPIE 0652, Set Up For Filter And Mirror Efficiencies Measurements In The UV and VUV Spectral Range, 0000 (13 October 1986); doi: 10.1117/12.938366
Proc. SPIE 0652, Inverse Synthesis For Analyzing The Variations Of Spectral Properties Of Optical Multilayers From Different Coating Runs, 0000 (13 October 1986); doi: 10.1117/12.938367
Proc. SPIE 0652, Quality Control And Ageing Tests On Replicated, Al/MgF2 Coated Aspheric Mirrors For The Far UV, 0000 (13 October 1986); doi: 10.1117/12.938368
Proc. SPIE 0652, Mechanical Properties Of Coatings Revealed By Ultra Low Load (VICKERS) Hardness Measurements In A SEM, 0000 (13 October 1986); doi: 10.1117/12.938369
Proc. SPIE 0652, Micro-/Ultramicro Hardness Measurements with Insulating Films, 0000 (13 October 1986); doi: 10.1117/12.938370
Proc. SPIE 0652, Optical Absorption In Amorphous Semiconductor Films, 0000 (13 October 1986); doi: 10.1117/12.938371
Proc. SPIE 0652, Thin Film Refractive Index Determination By Different Techniques, 0000 (13 October 1986); doi: 10.1117/12.938372
Proc. SPIE 0652, Effects Of Dispersion On The Determination Of Optical Constants Of Thin Films, 0000 (13 October 1986); doi: 10.1117/12.938373
Proc. SPIE 0652, Optical Properties Of Noble Metal Like Films, 0000 (13 October 1986); doi: 10.1117/12.938374
Proc. SPIE 0652, Optical Constants of Individual Films in Multilayers, 0000 (13 October 1986); doi: 10.1117/12.938375
Proc. SPIE 0652, New Phenomenological Approach For The Optical Dielectric Function Of Inhomogeneous Media Near The Percolation, 0000 (13 October 1986); doi: 10.1117/12.938376
Proc. SPIE 0652, Optical Properties Of Thin Silicides Layers, 0000 (13 October 1986); doi: 10.1117/12.938377
Proc. SPIE 0652, Ellipsometric Methods of Characterization of Optical Thin Films, 0000 (13 October 1986); doi: 10.1117/12.938378
Proc. SPIE 0652, Laser Damage To Optical Coatings -- A Continuing Challenge, 0000 (13 October 1986); doi: 10.1117/12.938379
Proc. SPIE 0652, On The Determination Of Optical Constants Of Films In Multilayers, 0000 (13 October 1986); doi: 10.1117/12.938380
Proc. SPIE 0652, Pratical Techniques For The Determination Of Optical Constants, 0000 (13 October 1986); doi: 10.1117/12.938381
Proc. SPIE 0652, Non-Optical Characterization Techniques For Optical Coatings, 0000 (13 October 1986); doi: 10.1117/12.938382
Proc. SPIE 0652, Light Scattering And Characterization Of Thin Films, 0000 (13 October 1986); doi: 10.1117/12.938383
Proc. SPIE 0652, Ion And Photon-Beam Assisted Deposition Of Thin Films, 0000 (13 October 1986); doi: 10.1117/12.938384
Proc. SPIE 0652, Optical Constants Of Thin Silver And Titanium Nitride Films, 0000 (13 October 1986); doi: 10.1117/12.938385
Proc. SPIE 0652, Low Temperature Photo-CVD Silicon Nitride Characterization, 0000 (13 October 1986); doi: 10.1117/12.938386
Proc. SPIE 0652, Optical Study Of The Growth Of Ta2O5 and SiO2 Layers Obtained By Ion Assisted Deposition, 0000 (13 October 1986); doi: 10.1117/12.938387
Proc. SPIE 0652, Measurement Of Scattering Distribution For Characterization Of The Roughness Of Coated Or Uncoated Substrates, 0000 (13 October 1986); doi: 10.1117/12.938388
Proc. SPIE 0652, Total Integrated Scatter Measurement System For Quality Assessment Of Coatings On Optical Surfaces, 0000 (13 October 1986); doi: 10.1117/12.938389
Proc. SPIE 0652, The Measurement Of Absorption In Thin Films By Laser Calorimetry, 0000 (13 October 1986); doi: 10.1117/12.938390
Proc. SPIE 0652, Theoretical Model For Evaluating Transient Temperature Distribution In Rugate Optical Thin Film Coatings Subject To High Power Continuous Wave And Repetitive Pulsed Lasers, 0000 (13 October 1986); doi: 10.1117/12.938391
Proc. SPIE 0652, Theoretical Model For Evaluating Transient Temperature Distribution In Rugate Optical Thin Film Coatings Subject To High Power Continuous Wave And Repetitive Pulsed Lasers, 0000 (13 October 1986); doi: 10.1117/12.938392
Proc. SPIE 0652, Coherence Loss Due To Thin Film Interface Roughness, 0000 (13 October 1986); doi: 10.1117/12.938393
Proc. SPIE 0652, Optimization Of Technology For The Systems Of Hard-Oxide Layers By Spectroscopic Methods, 0000 (13 October 1986); doi: 10.1117/12.938394
Proc. SPIE 0652, Applications, Devices, And Markets For Optical Coatings, 0000 (13 October 1986); doi: 10.1117/12.938395
Proc. SPIE 0652, Performance Of Sputter Deposited Multi Layer X-Ray Mirrors, 0000 (13 October 1986); doi: 10.1117/12.938396
Proc. SPIE 0652, Efficient Infrared Reflection Polarizers Using Transparent High-Index Films On Transparent Low-Index Substrates, 0000 (13 October 1986); doi: 10.1117/12.938397
Proc. SPIE 0652, Computer Simulation Of Evaporation Processes, 0000 (13 October 1986); doi: 10.1117/12.938398
Proc. SPIE 0652, Stability Of Hard Coating Filters, 0000 (13 October 1986); doi: 10.1117/12.938399
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