PROCEEDINGS VOLUME 0654
1986 INTERNATIONAL SYMPOSIUM/INNSBRUCK | 15-18 APRIL 1986
Automatic Optical Inspection
IN THIS VOLUME

0 Sessions, 41 Papers, 0 Presentations
All Papers  (41)
1986 INTERNATIONAL SYMPOSIUM/INNSBRUCK
15-18 April 1986
Innsbruck, Austria
All Papers
Proc. SPIE 0654, An Automated Electro-Optical Inspection System For Insitu Measurement Of Wear, 0000 (17 November 1986); doi: 10.1117/12.938260
Proc. SPIE 0654, Triangulation With Expanded Range Of Depth, 0000 (17 November 1986); doi: 10.1117/12.938261
Proc. SPIE 0654, A Fast Time-Of-Flight Distance Sensor For Industrial Applications, 0000 (17 November 1986); doi: 10.1117/12.938262
Proc. SPIE 0654, A New Method For Measuring The Time-Of-Flight In Fast Laser Range Finding, 0000 (17 November 1986); doi: 10.1117/12.938263
Proc. SPIE 0654, Real-Time High Accuracy Measurements Utilizing Line-Scan Image Sensors, 0000 (17 November 1986); doi: 10.1117/12.938264
Proc. SPIE 0654, Television Measurement For Railway Structure Gauging, 0000 (17 November 1986); doi: 10.1117/12.938265
Proc. SPIE 0654, Electro-Optical Inspection For Tolerance Control As An Integral Part Of A Flexible Machining Cell, 0000 (17 November 1986); doi: 10.1117/12.938266
Proc. SPIE 0654, Observable Trends In Commercially Available Automated Optical Inspection Systems, 0000 (17 November 1986); doi: 10.1117/12.938267
Proc. SPIE 0654, Automatic Inspection In Car Industry : User Point-Of-View, 0000 (17 November 1986); doi: 10.1117/12.938268
Proc. SPIE 0654, Optical Characterization Of Microrough Surfaces : Limitations And Success Of The Theory, 0000 (17 November 1986); doi: 10.1117/12.938269
Proc. SPIE 0654, Scratches: At What Price Quality, 0000 (17 November 1986); doi: 10.1117/12.938270
Proc. SPIE 0654, Optical Sensors For Automated Surface Metrology, 0000 (17 November 1986); doi: 10.1117/12.938271
Proc. SPIE 0654, Videooptical Quality Control Of Coated Surfaces, 0000 (17 November 1986); doi: 10.1117/12.938272
Proc. SPIE 0654, Automated Electronic Speckle Pattern Interferometry - A Tool for Inspection, 0000 (17 November 1986); doi: 10.1117/12.938273
Proc. SPIE 0654, The Present Status Of Electronic Speckle Pattern Interferometry (E.S.P.I.) With Respect To Automatic Inspection And Measurement, 0000 (17 November 1986); doi: 10.1117/12.938274
Proc. SPIE 0654, Holographic Real Image Measurement Using A Computer Controlled,Closed Circuit Television System, 0000 (17 November 1986); doi: 10.1117/12.938275
Proc. SPIE 0654, Measurement In Vision - The Need for Calibration, 0000 (17 November 1986); doi: 10.1117/12.938276
Proc. SPIE 0654, Applications of Colour Processing In Optical Inspection, 0000 (17 November 1986); doi: 10.1117/12.938277
Proc. SPIE 0654, How Grey-Scale Processing Improves Vision System Performance, 0000 (17 November 1986); doi: 10.1117/12.938278
Proc. SPIE 0654, Automatic Optical Measurement Of Contact Lenses, 0000 (17 November 1986); doi: 10.1117/12.938279
Proc. SPIE 0654, Automatic Non Contact Measurement System For The Inspection Of Shapes Cut In Sheet Material, 0000 (17 November 1986); doi: 10.1117/12.938280
Proc. SPIE 0654, High Speed Alignment And Inspection In The Electronics Industry, 0000 (17 November 1986); doi: 10.1117/12.938281
Proc. SPIE 0654, Automated Defect Inspection For In-Process Semiconductor Devices, 0000 (17 November 1986); doi: 10.1117/12.938282
Proc. SPIE 0654, Automatic Inspection In Electronics Manufacturing, 0000 (17 November 1986); doi: 10.1117/12.938283
Proc. SPIE 0654, A Novel Fibre Optic Illuminator for Machine Vision, 0000 (17 November 1986); doi: 10.1117/12.938284
Proc. SPIE 0654, Dimensional Measurement Of Moving Holes Using Spatial Filtering, 0000 (17 November 1986); doi: 10.1117/12.938285
Proc. SPIE 0654, Measurement Of Velocity With Cross-Correlation Technique For An Industrial Application, 0000 (17 November 1986); doi: 10.1117/12.938286
Proc. SPIE 0654, Application of an Optical Correlator to Industrial Inspection, 0000 (17 November 1986); doi: 10.1117/12.938287
Proc. SPIE 0654, System For Automatic Detection And Recognition Of Defects In Textile Slivers, 0000 (17 November 1986); doi: 10.1117/12.938288
Proc. SPIE 0654, In-Line Measurement Of Food Quality Using Light Emitting Diodes (LEDS) And Fibre Optics, 0000 (17 November 1986); doi: 10.1117/12.938289
Proc. SPIE 0654, Vision Systems for Character Recognition in Industrial Applications, 0000 (17 November 1986); doi: 10.1117/12.938290
Proc. SPIE 0654, A High Speed Automated Visual Inspection System, 0000 (17 November 1986); doi: 10.1117/12.938291
Proc. SPIE 0654, Automated Chromosome Analysis: A State-Of-The-Art Approach To Knowledge Based Image Analysis, 0000 (17 November 1986); doi: 10.1117/12.938292
Proc. SPIE 0654, Automatic Off-Axis OTF Testing, 0000 (17 November 1986); doi: 10.1117/12.938293
Proc. SPIE 0654, Self-Adaptive Optical Color Discrimination, 0000 (17 November 1986); doi: 10.1117/12.938294
Proc. SPIE 0654, Automated Analysis Of Polymer Mixing Using An Industrial Vision System, 0000 (17 November 1986); doi: 10.1117/12.938295
Proc. SPIE 0654, New Computer-Aided System For Automatic Fringe Analysis In Optical Metrologies, 0000 (17 November 1986); doi: 10.1117/12.938296
Proc. SPIE 0654, Holographic Non Destructive Testing With Automatic Evaluation, 0000 (17 November 1986); doi: 10.1117/12.938297
Proc. SPIE 0654, An Appraisal Of Artificial Intelligence Techniques For Industrial Vision Systems, 0000 (17 November 1986); doi: 10.1117/12.938298
Proc. SPIE 0654, An Expert System For Aircraft Design, 0000 (17 November 1986); doi: 10.1117/12.938299
Proc. SPIE 0654, Model-Based Vision: Using Cues To Select Hypotheses, 0000 (17 November 1986); doi: 10.1117/12.938300
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