PROCEEDINGS VOLUME 0661
1986 QUEBEC SYMPOSIUM | 3-6 JUNE 1986
Optical Testing and Metrology
IN THIS VOLUME

0 Sessions, 63 Papers, 0 Presentations
All Papers  (63)
1986 QUEBEC SYMPOSIUM
3-6 June 1986
Quebec City, Canada
All Papers
Proc. SPIE 0661, Optical Processing And Holography With Incoherent Light, 0000 (25 November 1986); doi: 10.1117/12.938585
Proc. SPIE 0661, Application Of White-Light Processing To Interferometric Studies, 0000 (25 November 1986); doi: 10.1117/12.938586
Proc. SPIE 0661, Observation Of Difference Displacement Fringes Using Comparative Holography And Its Application To The Detection Of Concealed Flaws, 0000 (25 November 1986); doi: 10.1117/12.938587
Proc. SPIE 0661, Holographic NDT On Pipes: Predicted Fringe Patterns And Experimental Results, 0000 (25 November 1986); doi: 10.1117/12.938588
Proc. SPIE 0661, Statistical Analysis Of Holographic Fringe Formation And Localization, 0000 (25 November 1986); doi: 10.1117/12.938589
Proc. SPIE 0661, Generalized Far-Field Holography At Non-Image Planes, 0000 (25 November 1986); doi: 10.1117/12.938590
Proc. SPIE 0661, Image Reconstruction Techniques For Computed Tomography From Sparse Data: X-Ray Imaging On The Varennes Tokamak And Other Applications., 0000 (25 November 1986); doi: 10.1117/12.938591
Proc. SPIE 0661, Utilisation Of Vector Nature Of Light In Imagery And Image Processing, 0000 (25 November 1986); doi: 10.1117/12.938592
Proc. SPIE 0661, Deformation Measurements At Very High Temperatures By ESPI And Moire Methods, 0000 (25 November 1986); doi: 10.1117/12.938593
Proc. SPIE 0661, Common Path Interferometer Using Optically Induced Molecular Reorientation In Liquid Crystals, 0000 (25 November 1986); doi: 10.1117/12.938594
Proc. SPIE 0661, A Phase Measuring Radial Shear Interferometer For Measuring The Wavefronts Of Compact Disc Laser Pickups, 0000 (25 November 1986); doi: 10.1117/12.938595
Proc. SPIE 0661, Photometric Ordering Of Ordinary Moire Fringes, 0000 (25 November 1986); doi: 10.1117/12.938596
Proc. SPIE 0661, Automatic Alignment Technique For X-Ray Lithography Using Moire Signals In Reflection, 0000 (25 November 1986); doi: 10.1117/12.938597
Proc. SPIE 0661, Development Of Double Twin Path Laser Interferometer For Thin Film Thickness Measurement, 0000 (25 November 1986); doi: 10.1117/12.938598
Proc. SPIE 0661, Comparison Of Harmonic Weighting, Fitting, And Crossing Points For Locating Optical Interference Fringes, 0000 (25 November 1986); doi: 10.1117/12.938599
Proc. SPIE 0661, Optimal Removal Of All Mislocation Effects In Interferometric Tests., 0000 (25 November 1986); doi: 10.1117/12.938600
Proc. SPIE 0661, Phase Shifting Interferometry Using Polarization Component Phase Shifters, 0000 (25 November 1986); doi: 10.1117/12.938601
Proc. SPIE 0661, Infrared Interferometers At 10 µm, 0000 (25 November 1986); doi: 10.1117/12.938602
Proc. SPIE 0661, Fundamentals And Overview Of Fiberoptic Sensors, 0000 (25 November 1986); doi: 10.1117/12.938603
Proc. SPIE 0661, Overview Of Advanced Components For Fiber Optic Systems, 0000 (25 November 1986); doi: 10.1117/12.938604
Proc. SPIE 0661, Time Domain Referencing In Intensity Modulation Fiber Optic Sensing Systems, 0000 (25 November 1986); doi: 10.1117/12.938605
Proc. SPIE 0661, Electronics For A Closed Loop Fiber Optic Gyroscope, 0000 (25 November 1986); doi: 10.1117/12.938606
Proc. SPIE 0661, A Laser Feedback Control Design For Passive Ring Laser Gyros In A Very High Finesse Cavity, 0000 (25 November 1986); doi: 10.1117/12.938607
Proc. SPIE 0661, Laser Anemometry - Some Simple Errors, 0000 (25 November 1986); doi: 10.1117/12.938608
Proc. SPIE 0661, Interpretation Of SM Fiber OTDR Signatures, 0000 (25 November 1986); doi: 10.1117/12.938609
Proc. SPIE 0661, 1.3 µm All-fiber Passive Optical Rotation Sensor, 0000 (25 November 1986); doi: 10.1117/12.938610
Proc. SPIE 0661, Fiber Optic Acoustic Sensors, 0000 (25 November 1986); doi: 10.1117/12.938611
Proc. SPIE 0661, Ocean Applications Of Fibre Optic Sensors, 0000 (25 November 1986); doi: 10.1117/12.938612
Proc. SPIE 0661, A Fibre Optic Sensor For Remote Rotation Sensor, 0000 (25 November 1986); doi: 10.1117/12.938613
Proc. SPIE 0661, A Fibre Optic Remote Sensing Head For In Situ Chlorophyll-a Fluorescence Measurement In Phytoplankton, 0000 (25 November 1986); doi: 10.1117/12.938614
Proc. SPIE 0661, Wide Range Optical Fibre Microbending Sensor, 0000 (25 November 1986); doi: 10.1117/12.938615
Proc. SPIE 0661, A Fibre Optic Sensor Of Physiological Parameters, 0000 (25 November 1986); doi: 10.1117/12.938616
Proc. SPIE 0661, Integrated Electro-Optic Modulator For Ultra-High-Frequency Electric Field Sensing, 0000 (25 November 1986); doi: 10.1117/12.938617
Proc. SPIE 0661, Alignment And Evaluation Of Integrated Optic Components Using An OTDR, 0000 (25 November 1986); doi: 10.1117/12.938618
Proc. SPIE 0661, A Fiber Optic Sensor Sensitive To Normal Pressure And Shear Stress, 0000 (25 November 1986); doi: 10.1117/12.938619
Proc. SPIE 0661, Optical Metrology In Length And Mechanical Standards, 0000 (25 November 1986); doi: 10.1117/12.938620
Proc. SPIE 0661, Some Recent Advances In Speckle Techniques For Photomechanics And Optical Metrology*, 0000 (25 November 1986); doi: 10.1117/12.938621
Proc. SPIE 0661, Scattered Light Speckle And Its Application To Interior Strain Measurement, 0000 (25 November 1986); doi: 10.1117/12.938622
Proc. SPIE 0661, Measuring Small Rotation Rates With A Modified Michelson Interferometer., 0000 (25 November 1986); doi: 10.1117/12.938623
Proc. SPIE 0661, Laser Coordinate Measuring Machine For Cylindrical Parts, 0000 (25 November 1986); doi: 10.1117/12.938624
Proc. SPIE 0661, Standards For Three-Dimensional Mensuration With Electron Micrographs, 0000 (25 November 1986); doi: 10.1117/12.938625
Proc. SPIE 0661, Single-Hologram Method For Evaluating Displacement Field, 0000 (25 November 1986); doi: 10.1117/12.938626
Proc. SPIE 0661, Direct Holographic Determination Of The Rotation And Strain Fields By Means Of The Fringe Visibility Method, 0000 (25 November 1986); doi: 10.1117/12.938627
Proc. SPIE 0661, Three-Dimensional Surface Metrology Using A Computer Controlled Non-Contact Instrument, 0000 (25 November 1986); doi: 10.1117/12.938628
Proc. SPIE 0661, Measuring Step Heights Using An Optical Profiler, 0000 (25 November 1986); doi: 10.1117/12.938629
Proc. SPIE 0661, Surface Texture Measurement By Computer Vision, 0000 (25 November 1986); doi: 10.1117/12.938630
Proc. SPIE 0661, Transmission Grating Incorporated Displacement Sensor: A Critical Study Of The Sensor Parameters, 0000 (25 November 1986); doi: 10.1117/12.938631
Proc. SPIE 0661, Simultaneous Laser Beam Profiling And Scaling Using Diffraction Edge Waves (DEW), 0000 (25 November 1986); doi: 10.1117/12.938632
Proc. SPIE 0661, Long Range Laser Alignment Systems, 0000 (25 November 1986); doi: 10.1117/12.938633
Proc. SPIE 0661, Holographic Determination Of The Surface Shape By Means Of The Fringe Visibility Method, 0000 (25 November 1986); doi: 10.1117/12.938634
Proc. SPIE 0661, Sphericity Measurements Of Full Spheres Using Subaperture Optical Testing Techniques, 0000 (25 November 1986); doi: 10.1117/12.938635
Proc. SPIE 0661, Image Quality Evaluation For Aerial Lenses, 0000 (25 November 1986); doi: 10.1117/12.938636
Proc. SPIE 0661, An Optical Gun Muzzle Sensor To Improve Firing Accuracy, 0000 (25 November 1986); doi: 10.1117/12.938637
Proc. SPIE 0661, A New Test For Cylindrical Optics, 0000 (25 November 1986); doi: 10.1117/12.938638
Proc. SPIE 0661, Design And Characterization Of Graded Reflectivity Mirrors, 0000 (25 November 1986); doi: 10.1117/12.938639
Proc. SPIE 0661, Calibration Of Thermal Imagers, 0000 (25 November 1986); doi: 10.1117/12.938640
Proc. SPIE 0661, Experimental Study Of A Liquid Crystal Light Valve As A Component In A Real Time Optical Image Processing System, 0000 (25 November 1986); doi: 10.1117/12.938641
Proc. SPIE 0661, Interferometric Determination Of Anchoring Energy In Nematic Cells, 0000 (25 November 1986); doi: 10.1117/12.938642
Proc. SPIE 0661, Specifying Electronic Autocollimators, 0000 (25 November 1986); doi: 10.1117/12.938643
Proc. SPIE 0661, Film Thickness And Refractive Index Standard Reference Material Calibrated By Ellipsometry And Profilometry, 0000 (25 November 1986); doi: 10.1117/12.938644