PROCEEDINGS VOLUME 0897
1988 LOS ANGELES SYMPOSIUM: O-E/LASE '88 | 11-17 JANUARY 1988
Scanning Microscopy Technologies and Applications
IN THIS VOLUME

0 Sessions, 27 Papers, 0 Presentations
All Papers  (27)
1988 LOS ANGELES SYMPOSIUM: O-E/LASE '88
11-17 January 1988
Los Angeles, CA, United States
All Papers
Proc. SPIE 0897, Some History And Technology Of Scanning Microscopy, 0000 (12 July 1988); doi: 10.1117/12.944499
Proc. SPIE 0897, Scanning Tunneling Microscopy: Instrument Design And Application In Air And Vacuum, 0000 (12 July 1988); doi: 10.1117/12.944500
Proc. SPIE 0897, Creating And Observing Surface Features With A Scanning Tunneling Microscope, 0000 (12 July 1988); doi: 10.1117/12.944501
Proc. SPIE 0897, Probing Surfaces With The Atomic Force Microscope, 0000 (12 July 1988); doi: 10.1117/12.944502
Proc. SPIE 0897, Atomic Force Microscope: Implementations, 0000 (12 July 1988); doi: 10.1117/12.944504
Proc. SPIE 0897, The Scanning Optical Microscope: An Overview, 0000 (12 July 1988); doi: 10.1117/12.944505
Proc. SPIE 0897, Linear And Differential Techniques In The Scanning Optical Microscope, 0000 (12 July 1988); doi: 10.1117/12.944507
Proc. SPIE 0897, Infrared Beam Induced Contrast With Double Illumination, 0000 (12 July 1988); doi: 10.1117/12.944509
Proc. SPIE 0897, Deteriorating Effects Of Beam Truncation On Focus Sensing Systems, 0000 (12 July 1988); doi: 10.1117/12.944511
Proc. SPIE 0897, Photothermal Microscope, 0000 (12 July 1988); doi: 10.1117/12.944514
Proc. SPIE 0897, Ultra-Violet Confocal Metrology, 0000 (12 July 1988); doi: 10.1117/12.944516
Proc. SPIE 0897, Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments, 0000 (12 July 1988); doi: 10.1117/12.944518
Proc. SPIE 0897, Near-Field Scanning Optical Microscopy (NSOM), 0000 (12 July 1988); doi: 10.1117/12.944521
Proc. SPIE 0897, Surface Plasmon Scanning Microscopy, 0000 (12 July 1988); doi: 10.1117/12.944524
Proc. SPIE 0897, Scanning Capacitance Microscopy, 0000 (12 July 1988); doi: 10.1117/12.944526
Proc. SPIE 0897, Acoustic Microscopy, 0000 (12 July 1988); doi: 10.1117/12.944528
Proc. SPIE 0897, Thermal And Photothermal Imaging On A Sub 100 Nanometer Scale, 0000 (12 July 1988); doi: 10.1117/12.944530
Proc. SPIE 0897, Thermal Wave Imaging: Detection Of Subsurface Features In Opaque Solids, 0000 (12 July 1988); doi: 10.1117/12.944532
Proc. SPIE 0897, Externally Pressurised Bearings For Systems Leading To Nanometer Technology, 0000 (12 July 1988); doi: 10.1117/12.944534
Proc. SPIE 0897, Magnetic Bearings For Precision Linear Slides, 0000 (12 July 1988); doi: 10.1117/12.944535
Proc. SPIE 0897, Scanning Tomographic Acoustic Microscopy, 0000 (12 July 1988); doi: 10.1117/12.944538
Proc. SPIE 0897, Application Of The PIPE Image Processing Machine To Scanning Microscopy, 0000 (12 July 1988); doi: 10.1117/12.944540
Proc. SPIE 0897, Determination Of Fields Near A Silver Strip On A Glass Substrate, 0000 (12 July 1988); doi: 10.1117/12.944541
Proc. SPIE 0897, Scanning Soft X-Ray Microscopy, 0000 (12 July 1988); doi: 10.1117/12.944544
Proc. SPIE 0897, High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry, 0000 (12 July 1988); doi: 10.1117/12.944546
Proc. SPIE 0897, Image Processing And Control Workstation For Scanning Microscopy, 0000 (12 July 1988); doi: 10.1117/12.944549
Proc. SPIE 0897, High Resolution Phase Measuring Laser Interferometric Microscope For Engineering Surface Metrology, 0000 (12 July 1988); doi: 10.1117/12.944551
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