PROCEEDINGS VOLUME 0954
SPIE INTERNATIONAL SYMPOSIUM ON OPTICAL ENGINEERING AND INDUSTRIAL SENSING FOR ADVANCE MANUFACTURING TECHNOLOGIES | 27-30 JUNE 1988
Optical Testing and Metrology II
IN THIS VOLUME

0 Sessions, 92 Papers, 0 Presentations
All Papers  (92)
SPIE INTERNATIONAL SYMPOSIUM ON OPTICAL ENGINEERING AND INDUSTRIAL SENSING FOR ADVANCE MANUFACTURING TECHNOLOGIES
27-30 June 1988
Dearborn, MI, United States
All Papers
Proc. SPIE 0954, Some New Techniques For Imaging Through Inhomogeneities, 0000 (16 January 1989); doi: 10.1117/12.947565
Proc. SPIE 0954, Phase-Conjugate Interferometry Using Degenerate Four-Wave Mixing And Holography, 0000 (16 January 1989); doi: 10.1117/12.947566
Proc. SPIE 0954, Pulsed Holography With Computer Vision For Nondestructive Testing In The Field Environment, 0000 (16 January 1989); doi: 10.1117/12.947567
Proc. SPIE 0954, The Range Of Holographic Interferometry For Displacement Measuring, 0000 (16 January 1989); doi: 10.1117/12.947568
Proc. SPIE 0954, Alignment Verification Using Holographic Correlation, 0000 (16 January 1989); doi: 10.1117/12.947569
Proc. SPIE 0954, Characterization Of DCG Holograms During The Production Process: Some Practical Aspects, 0000 (16 January 1989); doi: 10.1117/12.947570
Proc. SPIE 0954, Holographic Interferometry Versus Lensless Speckle Photography, 0000 (16 January 1989); doi: 10.1117/12.947571
Proc. SPIE 0954, Aberration-Free Fraunhofer Holography Of Micro-Objects, 0000 (16 January 1989); doi: 10.1117/12.947572
Proc. SPIE 0954, What Can Be Interferometered?, 0000 (16 January 1989); doi: 10.1117/12.947573
Proc. SPIE 0954, Scan Interferometer, 0000 (16 January 1989); doi: 10.1117/12.947574
Proc. SPIE 0954, Phase-Measuring Interferometry: Applications And Techniques, 0000 (16 January 1989); doi: 10.1117/12.947575
Proc. SPIE 0954, Phase-Measuring Interferometry: Performance Characterization And Calibration, 0000 (16 January 1989); doi: 10.1117/12.947576
Proc. SPIE 0954, The Evaluation Of A Random Sampling Error On The Polynomial Fit Of Subaperture Test Data, 0000 (16 January 1989); doi: 10.1117/12.947577
Proc. SPIE 0954, Talbot Bands : Determination Of Material Dispersion, 0000 (16 January 1989); doi: 10.1117/12.947578
Proc. SPIE 0954, Optical Profiling Using An Interference Microscope, 0000 (16 January 1989); doi: 10.1117/12.947579
Proc. SPIE 0954, Coded Imaging By Self-Imaging Structures (SIS) And Applications, 0000 (16 January 1989); doi: 10.1117/12.947580
Proc. SPIE 0954, An Interpretation Of Moire Tnterferometry From Wavefront Interference Theory, 0000 (16 January 1989); doi: 10.1117/12.947581
Proc. SPIE 0954, Characterization Of Images Produced By Single And Multiple Apertures And Their Applications, 0000 (16 January 1989); doi: 10.1117/12.947582
Proc. SPIE 0954, Computer Moire© Deflectometry Using Talbot Effect, 0000 (16 January 1989); doi: 10.1117/12.947583
Proc. SPIE 0954, Moire Interferometry Applied To Topographic Contour Measurement, 0000 (16 January 1989); doi: 10.1117/12.947584
Proc. SPIE 0954, Reflection Lau Imaging And Its Application To Displacement Sensing, 0000 (16 January 1989); doi: 10.1117/12.947585
Proc. SPIE 0954, Moire Methods For Curvature Measurements, 0000 (16 January 1989); doi: 10.1117/12.947586
Proc. SPIE 0954, Comparison Of Interferometric Contouring Techniques, 0000 (16 January 1989); doi: 10.1117/12.947587
Proc. SPIE 0954, Interferometric Measurements Of Remote Surfaces Profile's Through An Optical Fiber, 0000 (16 January 1989); doi: 10.1117/12.947588
Proc. SPIE 0954, Comparison Of Optical And Mechanical Measurements Of Surface Finish, 0000 (16 January 1989); doi: 10.1117/12.947589
Proc. SPIE 0954, Industrial Applications Of An Optical Profilometer, 0000 (16 January 1989); doi: 10.1117/12.947590
Proc. SPIE 0954, Optical Enhancement Of Surface Contour Variations For Sheet Metal And Plastic Panel Inspection, 0000 (16 January 1989); doi: 10.1117/12.947591
Proc. SPIE 0954, Surface Measurements And Applications For Manufactured Parts Using Noncontact Profilometer, 0000 (16 January 1989); doi: 10.1117/12.947592
Proc. SPIE 0954, Coordinate Mastering Using Optical Coupling, 0000 (16 January 1989); doi: 10.1117/12.947593
Proc. SPIE 0954, Laser -Aided Spherometer, 0000 (16 January 1989); doi: 10.1117/12.947594
Proc. SPIE 0954, An Improved Fourier Transform Profilometry, 0000 (16 January 1989); doi: 10.1117/12.947595
Proc. SPIE 0954, Interferometric Measurement Of The Roughness Of Machined Parts, 0000 (16 January 1989); doi: 10.1117/12.947596
Proc. SPIE 0954, Automated Optical Rouginess Inspection, 0000 (16 January 1989); doi: 10.1117/12.947597
Proc. SPIE 0954, Comparison Of Techniques For The Measurement Of 3-Dimensional Surface Microtopography, 0000 (16 January 1989); doi: 10.1117/12.947598
Proc. SPIE 0954, Rough Surfaces Classification Using Fourier Transform, 0000 (16 January 1989); doi: 10.1117/12.947599
Proc. SPIE 0954, High Precision And Miniaturized Mark Position Sensing Methods For 3-D Shape Measurement, 0000 (16 January 1989); doi: 10.1117/12.947600
Proc. SPIE 0954, A Non-Contact ED Sensor For Irterferometric End Gauge Calibration, 0000 (16 January 1989); doi: 10.1117/12.947601
Proc. SPIE 0954, Profilometry In The Angstrom Region, 0000 (16 January 1989); doi: 10.1117/12.947602
Proc. SPIE 0954, The Development Of ESPI With View-Points Of Optical System Set-Ups, 0000 (16 January 1989); doi: 10.1117/12.947603
Proc. SPIE 0954, Digital Processing Of Young's Fringes In Speckle Photography, 0000 (16 January 1989); doi: 10.1117/12.947604
Proc. SPIE 0954, Optical Surface Inspection Using A Transverse Speckle Detection Technique, 0000 (16 January 1989); doi: 10.1117/12.947605
Proc. SPIE 0954, New Method Of Contouring Using Digital Speckle Pattern Interferometry (DSPI), 0000 (16 January 1989); doi: 10.1117/12.947606
Proc. SPIE 0954, A Fast Deformation Analysis Method By Digital Correlation Technique, 0000 (16 January 1989); doi: 10.1117/12.947607
Proc. SPIE 0954, Changed Parameter Method In Photomechanics, 0000 (16 January 1989); doi: 10.1117/12.947608
Proc. SPIE 0954, Holography In Science And Industry - Measurement With Picosecond Pulses, 0000 (16 January 1989); doi: 10.1117/12.947609
Proc. SPIE 0954, Elastic Scattering Of Light From A Few Atomic Dipoles On A Flat Metal Surface, 0000 (16 January 1989); doi: 10.1117/12.947610
Proc. SPIE 0954, Technologies In Aspherisation, 0000 (16 January 1989); doi: 10.1117/12.947611
Proc. SPIE 0954, Optical Flatness Standard II: Reduction Of Interferograms, 0000 (16 January 1989); doi: 10.1117/12.947612
Proc. SPIE 0954, In-Process Analysis Of Optical Components Machined On A Diamond Turning Lathe, 0000 (16 January 1989); doi: 10.1117/12.947613
Proc. SPIE 0954, Developments In Radial Metrology, 0000 (16 January 1989); doi: 10.1117/12.947614
Proc. SPIE 0954, Testing Reflective Optical Surfaces With A Non-Contacting Probe, 0000 (16 January 1989); doi: 10.1117/12.947615
Proc. SPIE 0954, State Of The Art Of Applications Of Holography In Medicine And Biology, 0000 (16 January 1989); doi: 10.1117/12.947616
Proc. SPIE 0954, Review Of Optical Methods In Immunosensing, 0000 (16 January 1989); doi: 10.1117/12.947617
Proc. SPIE 0954, Biomedical Aspects Of Optical Testing, 0000 (16 January 1989); doi: 10.1117/12.947618
Proc. SPIE 0954, Digital Image Correlation Measurements Of Strain In Bovine Retina, 0000 (16 January 1989); doi: 10.1117/12.947619
Proc. SPIE 0954, Some Experiments On The Perceived Size Of Laser Speckles, 0000 (16 January 1989); doi: 10.1117/12.947620
Proc. SPIE 0954, Traceability Of Optical Length Measurements, 0000 (16 January 1989); doi: 10.1117/12.947621
Proc. SPIE 0954, Alignment Aspects Of The Optical System On The VEGA Spacelabs, 0000 (16 January 1989); doi: 10.1117/12.947622
Proc. SPIE 0954, Applications Of Neural Networks To The Manufacturing Environment, 0000 (16 January 1989); doi: 10.1117/12.947623
Proc. SPIE 0954, Image Processing Techniques For Fringe Pattern Analysis, 0000 (16 January 1989); doi: 10.1117/12.947624
Proc. SPIE 0954, The Analysis Of Precision In Digital Image Metrology, 0000 (16 January 1989); doi: 10.1117/12.947625