PROCEEDINGS VOLUME 1009
1988 INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING | 19-23 SEPTEMBER 1988
Surface Measurement and Characterization
IN THIS VOLUME

0 Sessions, 33 Papers, 0 Presentations
All Papers  (33)
1988 INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING
19-23 September 1988
Hamburg, Germany
All Papers
Proc. SPIE 1009, Surface Measurement And Characterization, 0000 (21 March 1989); doi: 10.1117/12.949147
Proc. SPIE 1009, Automatic Inspection In Industry Today, 0000 (21 March 1989); doi: 10.1117/12.949148
Proc. SPIE 1009, On A Few Functions Of HIPOSS (High Precision Optical Surface Sensor) And Their Applications, 0000 (21 March 1989); doi: 10.1117/12.949150
Proc. SPIE 1009, Optical Methods Of Measuring Rough Surfaces, 0000 (21 March 1989); doi: 10.1117/12.949151
Proc. SPIE 1009, Chromatic Probe For Surface Microtopography Inspection And Analysis, 0000 (21 March 1989); doi: 10.1117/12.949152
Proc. SPIE 1009, High Resolution Phase Measuring Laser Interferometric Microscope For Engineering Surface Metrology, 0000 (21 March 1989); doi: 10.1117/12.949153
Proc. SPIE 1009, Instrumental Effects In Surface Finish Measurement, 0000 (21 March 1989); doi: 10.1117/12.949154
Proc. SPIE 1009, Limits Of Surface Measurement By Stylus Instruments, 0000 (21 March 1989); doi: 10.1117/12.949155
Proc. SPIE 1009, Limits Of Surface Measurement By Optical Probes, 0000 (21 March 1989); doi: 10.1117/12.949156
Proc. SPIE 1009, Statistical Analysis Of Random And Pseudo Random Rough Surfaces, 0000 (21 March 1989); doi: 10.1117/12.949157
Proc. SPIE 1009, Comparison Of Optical Scatterometer And Profilometer Techniques For Characterizing Smooth Surfaces, 0000 (21 March 1989); doi: 10.1117/12.949158
Proc. SPIE 1009, Scattering From Surfaces And Multilayer Coatings: Recent Advances For A Better Investigation Of Experiment, 0000 (21 March 1989); doi: 10.1117/12.949159
Proc. SPIE 1009, Measurement Of Scattering Curves Of Coated Or Uncoated Optical Surfaces: Experimental Techniques For Determining Surface Roughnesses, 0000 (21 March 1989); doi: 10.1117/12.949160
Proc. SPIE 1009, Comparison Of Light Scattering From Rough Surfaces With Optical And Mechanical Profilometry, 0000 (21 March 1989); doi: 10.1117/12.949161
Proc. SPIE 1009, Relationship Between Near-Angle Scatter And Surface Characteristics, 0000 (21 March 1989); doi: 10.1117/12.949163
Proc. SPIE 1009, Optimal Distribution Of Optical Fibers In Surface Roughness Sensor, 0000 (21 March 1989); doi: 10.1117/12.949164
Proc. SPIE 1009, Surface Smoothing Effects And Optical Scatter Characteristics Of Coated Metal Surfaces, 0000 (21 March 1989); doi: 10.1117/12.949165
Proc. SPIE 1009, A Practical Total Integrated Scatterometer, 0000 (21 March 1989); doi: 10.1117/12.949166
Proc. SPIE 1009, Characterization Of Mirror Surfaces For Laser-Gyro Applications, 0000 (21 March 1989); doi: 10.1117/12.949167
Proc. SPIE 1009, Characterization Of Supersmooth Surfaces By Light Scattering Techniques, 0000 (21 March 1989); doi: 10.1117/12.949168
Proc. SPIE 1009, Elastic Lightscattering Measurements Of Si-Surfaces, 0000 (21 March 1989); doi: 10.1117/12.949169
Proc. SPIE 1009, Interface Scattering Of Light From Oxidized Copper Surfaces, 0000 (21 March 1989); doi: 10.1117/12.949170
Proc. SPIE 1009, Assessment Of Surface Topography By X-Ray Scattering Measurements, 0000 (21 March 1989); doi: 10.1117/12.949171
Proc. SPIE 1009, X-UV And X-Ray Scattering Measurements From A Rough LiF Crystal Surface Characterized By Electron Micrography, 0000 (21 March 1989); doi: 10.1117/12.949172
Proc. SPIE 1009, Validation Of A Local Defect Classification Procedure, 0000 (21 March 1989); doi: 10.1117/12.949174
Proc. SPIE 1009, Visual Assessment And Instrumental Quantification Of Optical Surfaces And Thin Film Coatings Relative To Their Roughness And Light Scattering, 0000 (21 March 1989); doi: 10.1117/12.949175
Proc. SPIE 1009, LASSI - A Scanning Differential Ac Interferometer For Surface Profile And Roughness Measurement, 0000 (21 March 1989); doi: 10.1117/12.949176
Proc. SPIE 1009, Photon Tunneling Microscopy, 0000 (21 March 1989); doi: 10.1117/12.949177
Proc. SPIE 1009, Coherent Optical Analysis, Filtering And Correlation Of Reflected Images, 0000 (21 March 1989); doi: 10.1117/12.949178
Proc. SPIE 1009, Scanning Tunneling Microscopic Techniques Applied To Roughness Of Silver Surfaces, 0000 (21 March 1989); doi: 10.1117/12.949179
Proc. SPIE 1009, Ultrasonic Sensor For Measuring Surface Roughness, 0000 (21 March 1989); doi: 10.1117/12.949180
Proc. SPIE 1009, Application Of Non-Stereoscopic Secondary Electron Microscopy And Optical Spectroscopy For The Evaluation Of A Pronounced Microroughness, 0000 (21 March 1989); doi: 10.1117/12.949181
Proc. SPIE 1009, Use Of Surface Enhanced Raman Scattering To Characterize Metal Substrate, 0000 (21 March 1989); doi: 10.1117/12.949182
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