PROCEEDINGS VOLUME 1015
1988 INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING | 19-23 SEPTEMBER 1988
Micromachining Optical Components and Precision Engineering
IN THIS VOLUME

0 Sessions, 27 Papers, 0 Presentations
All Papers  (27)
1988 INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING
19-23 September 1988
Hamburg, Germany
All Papers
Proc. SPIE 1015, Generation Of Surface Topography By Interactions Of Vibrations, Spindle Speed And Feed Velocity, 0000 (11 April 1989); doi: 10.1117/12.949441
Proc. SPIE 1015, Manufacturing And Measuring Of Aspherics Integrated In One Ultra Precision Machine, 0000 (11 April 1989); doi: 10.1117/12.949442
Proc. SPIE 1015, Problems And Their Solutions When Thin-Walled Turned Parts Of High Precision With Quasi-Optical Surfaces Are Manufactured On A CNC Automatic Lathe Under Workshop Conditions, 0000 (11 April 1989); doi: 10.1117/12.949443
Proc. SPIE 1015, Ultra-Precision Airbearing Workspindles For The Economic Micro-Machining Of Optical Quality Components, 0000 (11 April 1989); doi: 10.1117/12.949444
Proc. SPIE 1015, Recent Developments In The Generation Of Glass Aspherical Surfaces, 0000 (11 April 1989); doi: 10.1117/12.949445
Proc. SPIE 1015, In Process Interferometry By Real-Time Fringe-Analysis, 0000 (11 April 1989); doi: 10.1117/12.949446
Proc. SPIE 1015, The Geometrical And Dynamical Behaviour Of Ultraprecision Diamond Turning Machines Set Limits To The Workpiece Accuracy, 0000 (11 April 1989); doi: 10.1117/12.949447
Proc. SPIE 1015, Surface Modulations On Metaloptics Caused By Vibrations In The Microturning Respectively Fly-Cutting Process, 0000 (11 April 1989); doi: 10.1117/12.949448
Proc. SPIE 1015, Finish Improvement Of Micro-Machined Surfaces, 0000 (11 April 1989); doi: 10.1117/12.949449
Proc. SPIE 1015, Interferometric Monitoring Of Spindle And Workpiece On An Ultra-Precision Single-Point Diamond Facing Machine, 0000 (11 April 1989); doi: 10.1117/12.949450
Proc. SPIE 1015, Lattice Strain Measurements In Silicon Micropositioning Elements By X-Ray Topography, 0000 (11 April 1989); doi: 10.1117/12.949451
Proc. SPIE 1015, Moire Deflectometry - A Ray Tracing Alternative To Interferometry, 0000 (11 April 1989); doi: 10.1117/12.949452
Proc. SPIE 1015, Design And Realisation Of An Optimized Coupler For Gaslasers And Polarisation Preserving Fibers, 0000 (11 April 1989); doi: 10.1117/12.949453
Proc. SPIE 1015, Modification Of The Statistical Microroughness Of Surfaces By Thin Film Deposition: A Model, 0000 (11 April 1989); doi: 10.1117/12.949454
Proc. SPIE 1015, Application Of Magnetic Bearing Spindle To Very High Precision Machining, 0000 (11 April 1989); doi: 10.1117/12.949455
Proc. SPIE 1015, Precision Measurements Of Material-Removal Rates In Superpolishing Sapphire, 0000 (11 April 1989); doi: 10.1117/12.949456
Proc. SPIE 1015, Calibration Of Optical And Mechanical Sensors By X-Ray Interferometry, 0000 (11 April 1989); doi: 10.1117/12.949457
Proc. SPIE 1015, Characterization Of Multi-Layered AlGaAs Structures Using X-Ray Diffraction And Optical Reflectometry, 0000 (11 April 1989); doi: 10.1117/12.949459
Proc. SPIE 1015, Objectives And Structures Of The International Organization For Standardization (ISO), 0000 (11 April 1989); doi: 10.1117/12.949461
Proc. SPIE 1015, ISO/TC 172 'Optics And Optical Instruments', 0000 (11 April 1989); doi: 10.1117/12.949463
Proc. SPIE 1015, ISO Standards For Optical Drawings, 0000 (11 April 1989); doi: 10.1117/12.949464
Proc. SPIE 1015, CAD/CAM-Interface For Optical Systems And Optical Drawings, 0000 (11 April 1989); doi: 10.1117/12.949465
Proc. SPIE 1015, Standardization Of Environmental Test Conditions, 0000 (11 April 1989); doi: 10.1117/12.949467
Proc. SPIE 1015, Objective Standards For Surface Flaws, 0000 (11 April 1989); doi: 10.1117/12.949468
Proc. SPIE 1015, Standards On Microscopes And Accessories (ISO TC 172/SC 5), 0000 (11 April 1989); doi: 10.1117/12.949470
Proc. SPIE 1015, Standards On Optical Materials And Coatings, 0000 (11 April 1989); doi: 10.1117/12.949472
Proc. SPIE 1015, Standards On Ophthalmic Lenses, 0000 (11 April 1989); doi: 10.1117/12.949473
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