PROCEEDINGS VOLUME 1028
1988 INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING | 19-23 SEPTEMBER 1988
Scanning Imaging
IN THIS VOLUME

0 Sessions, 38 Papers, 0 Presentations
All Papers  (38)
1988 INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING
19-23 September 1988
Hamburg, Germany
All Papers
Proc. SPIE 1028, Overview Of Coherent Oiptics Aulications In Metrology, 0000 (9 February 1989); doi: 10.1117/12.950294
Proc. SPIE 1028, Pupil Filters In Confocal Imaging, 0000 (9 February 1989); doi: 10.1117/12.950296
Proc. SPIE 1028, Axial Resolution Of A Confocal Scanning Optical Microscope, 0000 (9 February 1989); doi: 10.1117/12.950298
Proc. SPIE 1028, Spherical Aberration In Confocal Microscopy, 0000 (9 February 1989); doi: 10.1117/12.950300
Proc. SPIE 1028, Inverse Problems In Fluorescence Confocal Scanning Microscopy, 0000 (9 February 1989); doi: 10.1117/12.950302
Proc. SPIE 1028, Modelling Of 3-D Confocal Imaging At High Numerical Aperture In Fluorescence, 0000 (9 February 1989); doi: 10.1117/12.950303
Proc. SPIE 1028, Theoretical And Experimental Research On Super-Resolution Of Microscopes I. Partially Coherent Illumination And Resolving Power, 0000 (9 February 1989); doi: 10.1117/12.950305
Proc. SPIE 1028, A Scanning Differential Optical System For Simultaneous Phase And Amplitude Measurement, 0000 (9 February 1989); doi: 10.1117/12.950307
Proc. SPIE 1028, Excentration Errors Combined With Wavefront Aberration In A Coherent Scanning Microscope, 0000 (9 February 1989); doi: 10.1117/12.950309
Proc. SPIE 1028, Optimization Of Recording Conditions In Laser Scanning Microscopy, 0000 (9 February 1989); doi: 10.1117/12.950310
Proc. SPIE 1028, Phase-Shifting And Fourier Transforming For Sub-Micron Linewidth Measurement, 0000 (9 February 1989); doi: 10.1117/12.950312
Proc. SPIE 1028, Measurement Of The Degree Of Coherence In Conventional Microscopes, 0000 (9 February 1989); doi: 10.1117/12.950315
Proc. SPIE 1028, Confocal Interference Microscopy, 0000 (9 February 1989); doi: 10.1117/12.950317
Proc. SPIE 1028, Confocal And Conventional Modes In Tandem Scanning Reflected Light Microscopy, 0000 (9 February 1989); doi: 10.1117/12.950318
Proc. SPIE 1028, Imaging Theory For The Scanning Optical Microscope, 0000 (9 February 1989); doi: 10.1117/12.950320
Proc. SPIE 1028, Phase Imaging In Scanning Optical Microscopes, 0000 (9 February 1989); doi: 10.1117/12.950322
Proc. SPIE 1028, In Vivo Confocal Imaging Of The Eye Using Tandem Scanning Confocal Microscopy (TSCM):, 0000 (9 February 1989); doi: 10.1117/12.950323
Proc. SPIE 1028, Confocal Laser Scanning Microscopy For Ophthalmology, 0000 (9 February 1989); doi: 10.1117/12.950326
Proc. SPIE 1028, Scanning Microscope For Optically Sectioning The Living Cornea, 0000 (9 February 1989); doi: 10.1117/12.950328
Proc. SPIE 1028, Confocal Fluorescence Microscopes For Biological Research, 0000 (9 February 1989); doi: 10.1117/12.950329
Proc. SPIE 1028, An Apparatus For Laser Scanning Microscopy And Dynamic Testing Of Muscle Cells, 0000 (9 February 1989); doi: 10.1117/12.950333
Proc. SPIE 1028, Laser Scanning Microscopy To Study Molecular Transport In Single Cells, 0000 (9 February 1989); doi: 10.1117/12.950335
Proc. SPIE 1028, Confocal Fluorescence Microscopy Of Epithelial Cells, 0000 (9 February 1989); doi: 10.1117/12.950336
Proc. SPIE 1028, Inverted Confocal Microscopy For Biological And Material Applications, 0000 (9 February 1989); doi: 10.1117/12.950337
Proc. SPIE 1028, Applications Of The Microscope System LSM, 0000 (9 February 1989); doi: 10.1117/12.950340
Proc. SPIE 1028, Photoluminescence And Optical Beam Induced Current Imaging Of Defects, 0000 (9 February 1989); doi: 10.1117/12.950342
Proc. SPIE 1028, Minority Carrier Lifetime Mapping In Gallium Arsenide By Time-Resolved Photoluminescence Scanning Microscopy, 0000 (9 February 1989); doi: 10.1117/12.950343
Proc. SPIE 1028, Topography Of GaAs/AlgaAs Heterostructures Using The Lateral Photo Effect, 0000 (9 February 1989); doi: 10.1117/12.950344
Proc. SPIE 1028, Scanning Laser Photocurrent Spectroscopy Of Electrochemically Grown Bismuth Sulphide Films, 0000 (9 February 1989); doi: 10.1117/12.950346
Proc. SPIE 1028, Circuit Analysis In ICS Using The Scanning Laser Microscope, 0000 (9 February 1989); doi: 10.1117/12.950347
Proc. SPIE 1028, An Automated Latch-Up Measurement System Using A Laser Scanning Microscope, 0000 (9 February 1989); doi: 10.1117/12.950348
Proc. SPIE 1028, Infrared Laser Scan Microscope, 0000 (9 February 1989); doi: 10.1117/12.950349
Proc. SPIE 1028, Computerized Surface Plasmon Microscopy, 0000 (9 February 1989); doi: 10.1117/12.950350
Proc. SPIE 1028, Computerized analysis Of high resolution images by scanning acoustic microscopy, 0000 (9 February 1989); doi: 10.1117/12.950351
Proc. SPIE 1028, Semiconductor Laser Digital Scanner, 0000 (9 February 1989); doi: 10.1117/12.950352
Proc. SPIE 1028, Measurements Of Optical Waveguides By A Near-Field Scanning Technique, 0000 (9 February 1989); doi: 10.1117/12.950353
Proc. SPIE 1028, Reflectance And Optical Contrast Of Old Manuscripts: Wavelength Dependence, 0000 (9 February 1989); doi: 10.1117/12.950354
Proc. SPIE 1028, A Novel Opto-Electronic Method Of Position Measurement., 0000 (9 February 1989); doi: 10.1117/12.950355
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