Front Matter Vol. 10329
Proc. SPIE 10329, Front Matter: Volume 10329, 1032901 (29 June 2017); doi: 10.1117/12.2282982
Interometric Techniques I
Proc. SPIE 10329, Polarization and phase shifting interferometry, 1032903 (26 June 2017); doi: 10.1117/12.2269720
Proc. SPIE 10329, Increasing the accuracy of tilted-wave-interferometry by elimination of systematic errors, 1032904 (26 June 2017); doi: 10.1117/12.2270395
Proc. SPIE 10329, Full-field heterodyne dynamic interferometry based on hertz-level low differential-frequency acousto-optic frequency shifter, 1032905 (26 June 2017); doi: 10.1117/12.2270138
World of Photonics Congress-wide Plenary Session
Proc. SPIE 10329, Putting a spin on photons, 1032906 (26 June 2017); doi: 10.1117/12.2278897
Interometric Techniques II
Proc. SPIE 10329, Phase imaging using a single-pixel camera, 1032907 (26 June 2017); doi: 10.1117/12.2270074
Proc. SPIE 10329, Spatial-temporal phase shifting interferometry: suppressing phase errors in dynamic Fizeau interferometer, 1032909 (26 June 2017); doi: 10.1117/12.2271189
Proc. SPIE 10329, Study on measurement accuracy of active optics null test systems based on liquid crystal spatial light modulator and laser interferometer, 103290A (26 June 2017); doi: 10.1117/12.2269435
Digital Holography and Holographic Microscopy
Proc. SPIE 10329, Evaluation of refocus criteria for holographic particle imaging, 103290B (26 June 2017); doi: 10.1117/12.2271744
Proc. SPIE 10329, Topography measurements of high NA aspherical microlenses by digital holographic microscopy with spherical illumination, 103290C (26 June 2017); doi: 10.1117/12.2270150
Proc. SPIE 10329, Digital holography on moving objects: multiwavelength height measurements on inclined surfaces, 103290D (26 June 2017); doi: 10.1117/12.2270176
Proc. SPIE 10329, A method for total noise removal in digital holography based on enhanced grouping and sparsity enhancement filtering, 103290E (26 June 2017); doi: 10.1117/12.2271827
Proc. SPIE 10329, Miniaturized multiwavelength digital holography sensor for extensive in-machine tool measurement, 103290F (26 June 2017); doi: 10.1117/12.2270087
Proc. SPIE 10329, High-throughput single-shot hyperspectral interferometer for areal profilometry based on microlens array integral field unit, 103290G (26 June 2017); doi: 10.1117/12.2272003
OCT and Coherence Scanning
Proc. SPIE 10329, Tomographical process monitoring of laser transmission welding with OCT, 103290H (26 June 2017); doi: 10.1117/12.2269108
Proc. SPIE 10329, Non-destructive testing of layer-to-layer fusion of a 3D print using ultrahigh resolution optical coherence tomography, 103290I (26 June 2017); doi: 10.1117/12.2269807
Proc. SPIE 10329, Applications of optical coherence tomography in the non-contact assessment of automotive paints, 103290J (26 June 2017); doi: 10.1117/12.2270020
Proc. SPIE 10329, Single-shot multilayer measurement by chromatic confocal coherence tomography, 103290K (26 June 2017); doi: 10.1117/12.2270270
Proc. SPIE 10329, Tolerance on sphere radius for the calibration of the transfer function of coherence scanning interferometry, 103290L (26 June 2017); doi: 10.1117/12.2272041
High-Speed Techniques
Proc. SPIE 10329, GOBO projection for underwater 3D measurement technique, 103290N (26 June 2017); doi: 10.1117/12.2269981
Proc. SPIE 10329, Verification of real sensor motion for a high-dynamic 3D measurement inspection system, 103290O (26 June 2017); doi: 10.1117/12.2270288
Proc. SPIE 10329, High speed imaging for assessment of impact damage in natural fibre biocomposites, 103290P (26 June 2017); doi: 10.1117/12.2271617
Fringe Projection I
Proc. SPIE 10329, Miniaturization of an optical 3D sensor by additive manufacture of metallic mirrors, 103290Q (26 June 2017); doi: 10.1117/12.2269801
Proc. SPIE 10329, Platform for 3D inline process control in additive manufacturing, 103290R (26 June 2017); doi: 10.1117/12.2270493
Proc. SPIE 10329, Flexible registration method for light-stripe sensors considering sensor misalignments, 103290S (26 June 2017); doi: 10.1117/12.2269986
Fringe Projection II
Proc. SPIE 10329, Suppression of contrast-related artefacts in phase-measuring structured light techniques, 103290T (26 June 2017); doi: 10.1117/12.2269946
Proc. SPIE 10329, 3D geometry measurement of hot cylindric specimen using structured light, 103290U (26 June 2017); doi: 10.1117/12.2269607
Proc. SPIE 10329, Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing, 103290V (26 June 2017); doi: 10.1117/12.2270064
Proc. SPIE 10329, Experimental comparison of photogrammetry for additive manufactured parts with and without laser speckle projection, 103290W (26 June 2017); doi: 10.1117/12.2269507
Special Session: Spectroscopic Techniques in Industrial and Astronomical Applications
Proc. SPIE 10329, Comparison of astrophysical laser frequency combs with respect to the requirements of HIRES, 103290Y (26 June 2017); doi: 10.1117/12.2271846
Proc. SPIE 10329, The end-to-end simulator for the E-ELT HIRES high resolution spectrograph, 103290Z (26 June 2017); doi: 10.1117/12.2271953
Proc. SPIE 10329, Atomic layer sensitive in-situ plasma etch depth control with reflectance anisotropy spectroscopy (RAS), 1032911 (26 June 2017); doi: 10.1117/12.2269708
Proc. SPIE 10329, Photo-vibrational spectroscopy using quantum cascade laser and laser Doppler vibrometer, 1032912 (26 June 2017); doi: 10.1117/12.2269684
High-Resolution Profiling I
Proc. SPIE 10329, Three-dimensional Dammann confocal microscopy, 1032913 (26 June 2017); doi: 10.1117/12.2276581
Proc. SPIE 10329, Optical inspection of hidden MEMS structures, 1032914 (26 June 2017); doi: 10.1117/12.2269499
Proc. SPIE 10329, Confocal unrolled areal measurements of cylindrical surfaces, 1032915 (26 June 2017); doi: 10.1117/12.2269631
Proc. SPIE 10329, Transfer characteristics of optical profilers with respect to rectangular edge and step height measurement, 1032916 (26 June 2017); doi: 10.1117/12.2270185
Proc. SPIE 10329, Focus-variation microscopy for measurement of surface roughness and autocorrelation length, 1032917 (26 June 2017); doi: 10.1117/12.2271863
High-Resolution Profiling II
Proc. SPIE 10329, Sub-diffraction surface topography measurement using a microsphere-assisted Linnik interferometer, 1032918 (26 June 2017); doi: 10.1117/12.2270223
Proc. SPIE 10329, Measurement, certification and use of step-height calibration specimens in optical metrology, 1032919 (26 June 2017); doi: 10.1117/12.2269800
Proc. SPIE 10329, Surface profile measurement by using the integrated Linnik WLSI and confocal microscope system, 103291A (26 June 2017); doi: 10.1117/12.2270195
Proc. SPIE 10329, Super-resolution photonic nanojet interferometry: photonic nanojet interaction with a polymer sample, 103291B (26 June 2017); doi: 10.1117/12.2269519
Joint Session I: High-Precision Measurement of Optical Components and Systems
Proc. SPIE 10329, Combination of a fast white-light interferometer with a phase shifting interferometric line sensor for form measurements of precision components, 103291D (26 June 2017); doi: 10.1117/12.2269520
Proc. SPIE 10329, Birefringence measurement in complex optical systems, 103291F (26 June 2017); doi: 10.1117/12.2270194
Joint Session II: High-Precision Measurement of Optical Components and Systems
Proc. SPIE 10329, Dynamic interferometry: measurement of space optics and structures, 103291G (26 June 2017); doi: 10.1117/12.2276582
Proc. SPIE 10329, Preliminary results of a new proposal for objective human independent striae measurement, 103291I (26 June 2017); doi: 10.1117/12.2268989
Proc. SPIE 10329, Development of metrology for freeform optics in reflection mode, 103291K (26 June 2017); doi: 10.1117/12.2270284
Speckle Metrology
Proc. SPIE 10329, Deformation measurements by ESPI of the surface of a heated mirror and comparison with numerical model, 103291M (26 June 2017); doi: 10.1117/12.2270258
Proc. SPIE 10329, Reduction of phase singularities in a speckle Michelson setup, 103291N (26 June 2017); doi: 10.1117/12.2269429
Proc. SPIE 10329, Speckle-interferometric measurement system of 3D deformation to obtain thickness changes of thin specimen under tensile loads, 103291O (26 June 2017); doi: 10.1117/12.2269988
Proc. SPIE 10329, Uncertainty of scattered light roughness measurements based on speckle correlation methods, 103291P (26 June 2017); doi: 10.1117/12.2269171
Proc. SPIE 10329, Pre-treatment for preventing degradation of measurement accuracy by speckle noise in speckle interferometry, 103291Q (26 June 2017); doi: 10.1117/12.2269739
In-situ and Nondestructive Testing I
Proc. SPIE 10329, Optical residual stress measurement in TFT-LCD panels, 103291R (26 June 2017); doi: 10.1117/12.2276583
Proc. SPIE 10329, Calibration of the incident beam in a reflective topography measurement from an unknown surface, 103291S (26 June 2017); doi: 10.1117/12.2270291
Proc. SPIE 10329, Error influences of the shear element in interferometry for form characterization of optics, 103291T (26 June 2017); doi: 10.1117/12.2269932
Proc. SPIE 10329, An endoscopic shearography system with radial sensitivity for inner inspection of adhesion faults in composite material pipes, 103291V (26 June 2017); doi: 10.1117/12.2270289
Proc. SPIE 10329, Bulk strain solitons as a tool for determination of the third order elastic moduli of composite materials , 103291W (26 June 2017); doi: 10.1117/12.2270375