PROCEEDINGS VOLUME 1180
OE/FIBERS '89 | 5-7 SEPTEMBER 1989
Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
IN THIS VOLUME

0 Sessions, 19 Papers, 0 Presentations
All Papers  (19)
OE/FIBERS '89
5-7 September 1989
Boston, United States
All Papers
Proc. SPIE 1180, Fiber Optic System Reflection Noise, 0000 (23 January 1990); doi: 10.1117/12.963451
Proc. SPIE 1180, Automatic Remote Monitoring Of Fiber Optic Trunk Systems, 0000 (23 January 1990); doi: 10.1117/12.963452
Proc. SPIE 1180, Solution To OTDR Limitations For Automated Measurement, 0000 (23 January 1990); doi: 10.1117/12.963453
Proc. SPIE 1180, Backscatter Signature Generator For OTDR Calibration, 0000 (23 January 1990); doi: 10.1117/12.963454
Proc. SPIE 1180, Laser Testing of Integrated Circuits (ELASTIC®), 0000 (23 January 1990); doi: 10.1117/12.963455
Proc. SPIE 1180, Techniques For Characterization Of High-Loss Optical Fibers, 0000 (23 January 1990); doi: 10.1117/12.963456
Proc. SPIE 1180, On the Accuracy of Fiber Loss Measurements, 0000 (23 January 1990); doi: 10.1117/12.963457
Proc. SPIE 1180, A Universal Launch Multimode Fiber Optic Attenuation Test, 0000 (23 January 1990); doi: 10.1117/12.963458
Proc. SPIE 1180, Parametric Study Of Thermal Effects On Fiber Optic Arc Fusion Splicing, 0000 (23 January 1990); doi: 10.1117/12.963459
Proc. SPIE 1180, Measurement Of Mode Field Distribution And Evaluation Of Mode Field Radius In Single Mode Optical Waveguides, 0000 (23 January 1990); doi: 10.1117/12.963460
Proc. SPIE 1180, Testing Fiber Optic Couplers In A Mass Production Environment, 0000 (23 January 1990); doi: 10.1117/12.963461
Proc. SPIE 1180, Measurement of Spectral Dynamics in Single Quantum Well Lasers, 0000 (23 January 1990); doi: 10.1117/12.963462
Proc. SPIE 1180, Optoelectronic Methods For High Speed Measurement Of Laser Diode Performance, 0000 (23 January 1990); doi: 10.1117/12.963463
Proc. SPIE 1180, Measurement Of The Recombination Lifetime In Semiconductor Lasers Using rf Techniques, 0000 (23 January 1990); doi: 10.1117/12.963464
Proc. SPIE 1180, Measurements of Laser Self-Pulsation Frequency and Visibility for Optical Data Links, 0000 (23 January 1990); doi: 10.1117/12.963465
Proc. SPIE 1180, High-Power, Computer-Controlled Laser Diode Characterization Tester, 0000 (23 January 1990); doi: 10.1117/12.963466
Proc. SPIE 1180, A Video Processing System Capable of Performing Coherence Length Measurements and Characterization of Fiber-Coupled Laser Diodes, 0000 (23 January 1990); doi: 10.1117/12.963467
Proc. SPIE 1180, Laser Diode Characterization Instrumentation, 0000 (23 January 1990); doi: 10.1117/12.963468
Proc. SPIE 1180, Environmental Performance Of LiNbO3 Based Guided Wave Optical Devices, 0000 (23 January 1990); doi: 10.1117/12.963469
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